Hi Mr.Haas.

> -----Original Message-----
> From: Robert Haas <robertmh...@gmail.com>
> Sent: Wednesday, December 6, 2023 10:25 PM
> On Wed, Dec 6, 2023 at 3:41 AM fujii.y...@df.mitsubishielectric.co.jp
> <fujii.y...@df.mitsubishielectric.co.jp> wrote:
> > Are you concerned about the hassle and potential human errors of
> > manually adding new partial aggregation functions, rather than the catalog 
> > becoming bloated?
> 
> I'm concerned about both.
Understood. Thank you for your response.

> > The process of creating partial aggregation functions from aggregation
> > functions can be automated, so I believe this issue can be resolved.
> > However, automating it may increase the size of the patch even more, so 
> > overall, approach#2 might be better.
> > To implement approach #2, it would be necessary to investigate how much 
> > additional code is required.
> 
> Yes. Unfortunately I fear that there is quite a lot of work left to do here 
> in order to produce a committable feature. To me it
> seems necessary to conduct an investigation of approach #2. If the result of 
> that investigation is that nothing major
> stands in the way of approach #2, then I think we should adopt it, which is 
> more work. In addition, the problems around
> transmitting serialized bytea blobs between machines that can't be assumed to 
> fully trust each other will need to be
> addressed in some way, which seems like it will require a good deal of design 
> work, forming some kind of consensus, and
> then implementation work to follow. In addition to that there may be some 
> small problems that need to be solved at a
> detail level, such as the HAVING issue. I think the last category won't be 
> too hard to sort out, but that still leaves two really
> major areas to address.
Yes, I agree with you. It is clear that further investigation and discussion 
are still needed. 
I would be grateful if we can resolve this issue gradually. I would also like 
to continue the discussion if possible in the future.

Sincerely yours,
Yuuki Fujii

--
Yuuki Fujii
Information Technology R&D Center Mitsubishi Electric Corporation

Reply via email to