Upon further investigation, the device mapper observation does not seem to be a hard line, as I was able to observe panics when stressing both dm-0 and nvme0n1 under different circumstances.
At the moment, it also seems like the specific part of stress_ng_test that is the culprit is the "stress-ng aiol stressor". When running only the "aiol" stressor in isolation on linux-image-6.8.0-11-generic-64k, the panic reliably happens in under 5 minutes. Currently investigating to see if any other stress_ng tests cause the same issue on this kernel version, or if it is only aiol. -- You received this bug notification because you are a member of Ubuntu Bugs, which is subscribed to Ubuntu. https://bugs.launchpad.net/bugs/2058557 Title: Kernel panic during checkbox stress_ng_test on Grace running noble 6.8 (arm64+largemem) kernel To manage notifications about this bug go to: https://bugs.launchpad.net/ubuntu/+source/linux/+bug/2058557/+subscriptions -- ubuntu-bugs mailing list ubuntu-bugs@lists.ubuntu.com https://lists.ubuntu.com/mailman/listinfo/ubuntu-bugs
