Pavel Pisa created an issue:
https://gitlab.rtems.org/rtems/rtos/rtems/-/issues/5547
## Summary
My previous fix has exposed more breakage if internal SRAM self-tests is run
when code starts from Flash or external memory. The previous negated option has
disabled SRAM self-test in these cases and enabled it for code running from
SRAM which lead to code self-clear.
But when code is running from Flash and full safety should be achieved then
then SRAM test run through nested function
/* ESRAM Single Port PBIST */
tms570_pbist_run_and_check( 0x08300020U,
(uint32_t) PBIST_March13N_SP )
lead to situation when lr and r3 could not be restored in return from this
function. Memory content has been overwritten by tests.
The problem has been introduced by commit
b995211907aee43d0b23c3764cd342aae2afd10f bsp/tms570: Add
tms570_pbist_run_and_check()
Which is cross-referenced with issue #4982.
Problem is that it uses wrapper with calling even for SRAM test when stack is
placed in SRAM.
## Steps to reproduce
When tms570ls3137_hdk or tms570ls4357_hdk variant is build and flashed then
system ends with fatal error which keeps error pin set even over reset.
The proposed solution will follow. It return mostly to previous state based on
our work.
--
View it on GitLab: https://gitlab.rtems.org/rtems/rtos/rtems/-/issues/5547
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