(nuttx-apps) branch master updated: drivertest_i2c_spi: Supports incoming device nodes so we can test both iic and spi

[xiaoxiang]

This is an automated email from the ASF dual-hosted git repository.

xiaoxiang pushed a commit to branch master
in repository https://gitbox.apache.org/repos/asf/nuttx-apps.git


The following commit(s) were added to refs/heads/master by this push:
     new 8b17cfedf drivertest_i2c_spi: Supports incoming device nodes so we can 
test both iic and spi
8b17cfedf is described below

commit 8b17cfedf2c926836b6f0bf5c8b7f82d6db65593
Author: zhangshoukui <zhangshou...@xiaomi.com>
AuthorDate: Fri Oct 18 09:22:35 2024 +0800

    drivertest_i2c_spi: Supports incoming device nodes so we can test both iic 
and spi
    
    Signed-off-by: zhangshoukui <zhangshou...@xiaomi.com>
---
 testing/drivertest/drivertest_i2c_spi.c | 46 +++++++++++++++++++++++++++------
 1 file changed, 38 insertions(+), 8 deletions(-)

diff --git a/testing/drivertest/drivertest_i2c_spi.c 
b/testing/drivertest/drivertest_i2c_spi.c
index 1089b5245..93698010c 100644
--- a/testing/drivertest/drivertest_i2c_spi.c
+++ b/testing/drivertest/drivertest_i2c_spi.c
@@ -51,7 +51,7 @@
 
 struct test_state_s
 {
-  FAR const char *dev_path;
+  char dev_path[PATH_MAX];
   int fd;
 };
 
@@ -59,6 +59,19 @@ struct test_state_s
  * Private Functions
  ****************************************************************************/
 
+/****************************************************************************
+ * Name: show_usage
+ ****************************************************************************/
+
+static void show_usage(FAR const char *progname,
+                       FAR const char *path, int exitcode)
+{
+  printf("Usage: %s -d <devpath>\n", progname);
+  printf("  [-d devpath] Sensor device node.\n"
+         "  Default: %s Current: %s\n", ACC_DEVPATH, path);
+  exit(exitcode);
+}
+
 /****************************************************************************
  * Name: setup
  ****************************************************************************/
@@ -66,14 +79,10 @@ struct test_state_s
 static int setup(FAR void **state)
 {
   FAR struct test_state_s *test_state;
-  test_state = malloc(sizeof(struct test_state_s));
-  assert_true(test_state != NULL);
-
-  test_state->dev_path = ACC_DEVPATH;
+  test_state = (FAR struct test_state_s *)*state;
   test_state->fd = open(test_state->dev_path, O_RDONLY);
   assert_true(test_state->fd > 0);
 
-  *state = test_state;
   return 0;
 }
 
@@ -86,7 +95,6 @@ static int teardown(FAR void **state)
   FAR struct test_state_s *test_state;
   test_state = (FAR struct test_state_s *)*state;
   assert_int_equal(close(test_state->fd), 0);
-  free(test_state);
   return 0;
 }
 
@@ -131,9 +139,31 @@ static void read_from_device(FAR void **state)
 
 int main(int argc, FAR char *argv[])
 {
+  struct test_state_s test_state;
+  int ch;
+
+  memset(&test_state, 0, sizeof(test_state));
+  snprintf(test_state.dev_path, sizeof(test_state.dev_path), "%s",
+           ACC_DEVPATH);
+  while ((ch = getopt(argc, argv, "d:h")) != ERROR)
+    {
+      switch (ch)
+        {
+          case 'd':
+            snprintf(test_state.dev_path, sizeof(test_state.dev_path), "%s",
+                     optarg);
+            break;
+          case 'h':
+          case '?':
+            show_usage(argv[0], test_state.dev_path, EXIT_FAILURE);
+            break;
+        }
+    }
+
   const struct CMUnitTest tests[] =
     {
-      cmocka_unit_test_setup_teardown(read_from_device, setup, teardown),
+      cmocka_unit_test_prestate_setup_teardown(read_from_device, setup,
+                                               teardown, &test_state),
     };
 
   return cmocka_run_group_tests(tests, NULL, NULL);