Andreas Pakulat wrote: > On 09.01.06 09:34:53, Bastian Venthur wrote: >> hda: dma_intr: status=0x51 { DriveReady SeekComplete Error } >> hda: dma_intr: error=0x40 { UncorrectableError }, LBAsect=3408921, >> sector=3408919 >> ide: failed opcode was: unknown >> end_request: I/O error, dev hda, sector 3408919 >> EXT3-fs error (device hda1): ext3_get_inode_loc: unable to read inode >> block - inode=213891, block=426107 >> Remounting filesystem read-only >> >> Ich frag jetzt mal ganz panisch: neigt sich das Leben der Platte seinem >> Ende? > > Gut moeglich. > >> Wie kann man das überprüfen? > > Fuer kaputte Sektoren hilft badblocks, fuer andere Probleme hilft meist > SMART bei der Identifizierung (smartmontools installieren).
Ok ich habe jetzt einmal mit fsck die Platte (bzw. die erste Partition) getestet. Leider ist fsck nicht sehr geschwätzig und ich weis anhand der Ausgabe nicht, ob die Platte nun badblocks hat oder nicht: ------[fsck]------ [EMAIL PROTECTED]:~# fsck.ext3 -c /dev/hda1 e2fsck 1.34-WIP (21-May-2003) Checking for bad blocks (read-only test): done Pass 1: Checking inodes, blocks, and sizes Pass 2: Checking directory structure Pass 3: Checking directory connectivity Pass 4: Checking reference counts Pass 5: Checking group summary information /: ***** FILE SYSTEM WAS MODIFIED ***** /: 187313/549440 files (6.0% non-contiguous), 826085/1098586 blocks [EMAIL PROTECTED]:~# ------[fsck]------ Smartmon hab ich auch angeworfen aber auch hier weis ich mit der Ausgabe ('Schuldigung fürs Zumüllen) nix anzufangen: ------[smartmon]------ smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: IC25N020ATCS04-0 Serial Number: CSH206D9G9SUUF Firmware Version: CA2OA71A Device is: In smartctl database [for details use: -P show] ATA Version is: 5 ATA Standard is: ATA/ATAPI-5 T13 1321D revision 3 Local Time is: Mon Jan 9 14:48:33 2006 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 26) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 096 096 062 Pre-fail Always - 524288 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 117 117 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 090 090 000 Old_age Always - 16635 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 083 083 000 Old_age Always - 7872 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1941 191 G-Sense_Error_Rate 0x000a 095 095 000 Old_age Always - 327688 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 93 193 Load_Cycle_Count 0x0012 057 057 000 Old_age Always - 434023 194 Temperature_Celsius 0x0002 127 127 000 Old_age Always - 43 (Lifetime Min/Max 12/62) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 20 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 2 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 7870 hours (327 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 06 19 04 34 e0 Error: UNC 6 sectors at LBA = 0x00340419 = 3408921 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 17 04 34 e0 00 00:13:09.800 READ DMA ca 00 00 88 92 86 e0 00 00:13:09.800 WRITE DMA ca 00 00 88 91 86 e0 00 00:13:09.700 WRITE DMA ca 00 00 88 90 86 e0 00 00:13:09.700 WRITE DMA ca 00 00 88 8f 86 e0 00 00:13:09.700 WRITE DMA Error 1 occurred at disk power-on lifetime: 7777 hours (324 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 02 1d 04 34 e0 Error: UNC 2 sectors at LBA = 0x0034041d = 3408925 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 17 04 34 e0 00 00:08:13.900 READ DMA c8 00 08 3f 00 4c e0 00 00:08:13.900 READ DMA c8 00 08 ff 03 34 e0 00 00:08:13.800 READ DMA c8 00 08 47 00 4c e0 00 00:08:13.800 READ DMA c8 00 08 f7 e8 0b e0 00 00:08:13.800 READ DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging ------[smartmon]------ Kann jemand an den Ausgaben erkennen was der Platte passiert ist und was ihr evtl. bevorsteht? >> Falls das wichtig ist: es handelt sich um die Plate eines Acer-Notebooks >> und seit mindestens drei Jahren hatte ich nie Probleme mit der Platte. > > Naja, fuer so eine Notebookplatte die haeufig benutzt wird ist das keine > schlechte Lebensdauer wuerde ich mal sagen wollen. :( Für mich sind 3 Jahre gerade mal ein Jahr mehr als Garantie -- Ist das Standard, das man von seinem Notebook keine längere Lebenserwartung annehmen darf? Schöne Grüße Bastian -- Haeufig gestellte Fragen und Antworten (FAQ): http://www.de.debian.org/debian-user-german-FAQ/ Zum AUSTRAGEN schicken Sie eine Mail an [EMAIL PROTECTED] mit dem Subject "unsubscribe". Probleme? Mail an [EMAIL PROTECTED] (engl)