Hi,
-----Original Message-----
From: Parthasarathy, JananeeX M
Sent: Wednesday, October 31, 2018 2:30 PM
To: dev@dpdk.org
Cc: Marohn, Byron <byron.mar...@intel.com>; De Lara Guarch, Pablo
<pablo.de.lara.gua...@intel.com>; Pattan, Reshma <reshma.pat...@intel.com>;
Parthasarathy, JananeeX M <jananeex.m.parthasara...@intel.com>
Subject: [PATCH v2] test: reduce test duration for efd autotest
Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.
Commit message should be changed a bit to reflect v2 changes.
for (j = 0; j < ITERATIONS; j++) {
handle = rte_efd_create("test_efd", num_rules_in,
- EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+ sizeof(uint8_t), efd_get_all_sockets_bitmask(),
sizeof(uint8_t) ==> sizeof(simple_key). Now simple key is of type uint64_t.
Other than that. Please keep my ack in next version.
Acked-by: Reshma Pattan <reshma.pat...@intel.com>
