"Burakov, Anatoly" <[email protected]> writes: > On 22-Aug-19 8:18 AM, Chaitanya Babu, TalluriX wrote: >> Hi Aaron, >> >>> -----Original Message----- >>> From: Aaron Conole [mailto:[email protected]] >>> Sent: Wednesday, August 21, 2019 9:15 PM >>> To: Chaitanya Babu, TalluriX <[email protected]> >>> Cc: [email protected]; Pattan, Reshma <[email protected]>; >>> Parthasarathy, JananeeX M <[email protected]>; >>> Burakov, Anatoly <[email protected]> >>> Subject: Re: [dpdk-dev] [PATCH 3/3] app/test: add unit tests for eal vfio >>> >>> Chaitanya Babu Talluri <[email protected]> writes: >>> >>>> Unit test cases are added for eal vfio library. >>>> eal_vfio_autotest added to meson build file. >>>> >>>> Signed-off-by: Chaitanya Babu Talluri >>>> <[email protected]> >>>> --- >>> >>> Thanks for adding unit tests for the vfio library. >>> >>> In this case, there seems to be some failures - can you help determine the >>> cause: >>> >> As per log we observed >> "EAL: VFIO support not initialized" >> >> Can you Please check if device is binded or not with vfio-pci. >> If device is not binded we might get this error (EAL: VFIO support not >> initialized). >> >> We have binded the device and observed the tests are running fine as >> expected. >> >>> https://travis-ci.com/ovsrobot/dpdk/jobs/227066776 >> > > The test should be skipped if VFIO if VFIO is not initialized.
+1 - not every developer will have that set up for their systems. And for those developers building drive-by patches, we shouldn't make the unit tests unusable. > I think > we have an API for that, although it is not meant to be used by > application code.
