W dniu 15.07.2020 o 22:20, Honnappa Nagarahalli pisze:
> Change the log level for RTE_TEST_ASSERT macro to error to help
> log errors while running test cases.
>
> Signed-off-by: Honnappa Nagarahalli <honnappa.nagaraha...@arm.com>
> ---
> lib/librte_eal/include/rte_test.h | 2 +-
> 1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/lib/librte_eal/include/rte_test.h
> b/lib/librte_eal/include/rte_test.h
> index 89e47f47a..62c8f165a 100644
> --- a/lib/librte_eal/include/rte_test.h
> +++ b/lib/librte_eal/include/rte_test.h
> @@ -18,7 +18,7 @@
>
> #define RTE_TEST_ASSERT(cond, msg, ...) do {
> \
> if (!(cond)) { \
> - RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: " \
> + RTE_LOG(ERR, EAL, "Test assert %s line %d failed: " \
> msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
> RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
> return -1; \
Acked-by: Lukasz Wojciechowski <l.wojciec...@partner.samsung.com>
--
Lukasz Wojciechowski
Principal Software Engineer
Samsung R&D Institute Poland
Samsung Electronics
Office +48 22 377 88 25
l.wojciec...@partner.samsung.com
