Check that externally calibrated SFF-8472 values out of the range of their 16-bit fields saturate at both ends, for formula 1 (temperature, voltage, TX bias and TX power) and for the RX power polynomial, and that calibrated values are rounded to the nearest.
Signed-off-by: Roman Khromenok <[email protected]> --- app/test/test_ethdev_module_eeprom.c | 96 ++++++++++++++++++++++++++++ 1 file changed, 96 insertions(+) diff --git a/app/test/test_ethdev_module_eeprom.c b/app/test/test_ethdev_module_eeprom.c index b07a18aa06..1956fdd440 100644 --- a/app/test/test_ethdev_module_eeprom.c +++ b/app/test/test_ethdev_module_eeprom.c @@ -305,6 +305,99 @@ test_module_eeprom_sfp_8472_rx_power_polynomial(void) return TEST_SUCCESS; } +/* SFF-8472 module externally calibrated with unit slopes and zero offsets */ +static void +fill_sfp_ext_cal(uint8_t *data) +{ + uint8_t *a2 = data + RTE_ETH_MODULE_SFF_8079_LEN; + + fill_sfp(data); + /* diagnostics implemented, externally calibrated, average RX power */ + data[92] = 0x58; + a2[76] = 1; /* TX bias slope */ + a2[80] = 1; /* TX power slope */ + a2[84] = 1; /* temperature slope */ + a2[88] = 1; /* voltage slope */ + put_be_float(a2, 68, 0x3f800000); /* RX_PWR(1) = 1.0 */ +} + +static int +test_module_eeprom_sfp_8472_cal_saturate_max(void) +{ + uint8_t data[RTE_ETH_MODULE_SFF_8472_LEN]; + uint8_t *a2 = data + RTE_ETH_MODULE_SFF_8079_LEN; + + fill_sfp_ext_cal(data); + /* results above the 16-bit range must saturate */ + put_u16(a2, 100, 65535); /* raw TX bias */ + put_u16(a2, 76, 0xffff); /* TX bias slope = 255.996 */ + put_u16(a2, 102, 60000); /* raw TX power */ + put_u16(a2, 82, 10000); /* TX power offset */ + put_u16(a2, 96, 0x7f00); /* raw temperature: 127 C */ + put_u16(a2, 84, 0x0200); /* temperature slope = 2.0 */ + put_u16(a2, 98, 60000); /* raw voltage */ + put_u16(a2, 90, 10000); /* voltage offset */ + put_u16(a2, 104, 65535); /* raw RX power */ + put_be_float(a2, 56, 0x3f800000); /* RX_PWR(4) = 1.0 */ + + TEST_ASSERT_SUCCESS(parse(RTE_ETH_MODULE_SFF_8472, data, sizeof(data)), + "Failed to parse externally calibrated SFF-8472 data"); + CHECK_FIELD("Laser bias current", "131.070 mA"); + CHECK_FIELD("Laser output power", "6.5535 mW / 8.16 dBm"); + CHECK_FIELD("Module temperature", "128.00 degrees C / 262.39 degrees F"); + CHECK_FIELD("Module voltage", "6.5535 V"); + CHECK_FIELD("Receiver signal average optical power", "6.5535 mW / 8.16 dBm"); + return TEST_SUCCESS; +} + +static int +test_module_eeprom_sfp_8472_cal_saturate_min(void) +{ + uint8_t data[RTE_ETH_MODULE_SFF_8472_LEN]; + uint8_t *a2 = data + RTE_ETH_MODULE_SFF_8079_LEN; + + fill_sfp_ext_cal(data); + /* results below the 16-bit range must saturate */ + put_u16(a2, 100, 100); /* raw TX bias */ + put_u16(a2, 78, -1000); /* TX bias offset */ + put_u16(a2, 102, 100); /* raw TX power */ + put_u16(a2, 82, -1000); /* TX power offset */ + put_u16(a2, 96, 0x8100); /* raw temperature: -127 C */ + put_u16(a2, 84, 0x0200); /* temperature slope = 2.0 */ + put_u16(a2, 98, 100); /* raw voltage */ + put_u16(a2, 90, -1000); /* voltage offset */ + put_be_float(a2, 68, 0xbf800000); /* RX_PWR(1) = -1.0 */ + + TEST_ASSERT_SUCCESS(parse(RTE_ETH_MODULE_SFF_8472, data, sizeof(data)), + "Failed to parse externally calibrated SFF-8472 data"); + CHECK_FIELD("Laser bias current", "0.000 mA"); + CHECK_FIELD("Laser output power", "0.0000 mW / -inf dBm"); + CHECK_FIELD("Module temperature", "-128.00 degrees C / -198.40 degrees F"); + CHECK_FIELD("Module voltage", "0.0000 V"); + CHECK_FIELD("Receiver signal average optical power", "0.0000 mW / -inf dBm"); + return TEST_SUCCESS; +} + +static int +test_module_eeprom_sfp_8472_cal_round(void) +{ + uint8_t data[RTE_ETH_MODULE_SFF_8472_LEN]; + uint8_t *a2 = data + RTE_ETH_MODULE_SFF_8079_LEN; + + fill_sfp_ext_cal(data); + /* calibrated values must be rounded to the nearest, not truncated */ + put_u16(a2, 100, 3); /* raw TX bias */ + put_u16(a2, 76, 0x0180); /* TX bias slope = 1.5 */ + put_u16(a2, 104, 1000); /* raw RX power */ + put_be_float(a2, 68, 0x3f333333); /* RX_PWR(1) = 0.7, stored as 0.69999999 */ + + TEST_ASSERT_SUCCESS(parse(RTE_ETH_MODULE_SFF_8472, data, sizeof(data)), + "Failed to parse externally calibrated SFF-8472 data"); + CHECK_FIELD("Laser bias current", "0.010 mA"); + CHECK_FIELD("Receiver signal average optical power", "0.0700 mW / -11.55 dBm"); + return TEST_SUCCESS; +} + static int test_module_eeprom_invalid(void) { @@ -355,6 +448,9 @@ static struct unit_test_suite module_eeprom_testsuite = { TEST_CASE(test_module_eeprom_sfp_8472_short), TEST_CASE(test_module_eeprom_sfp_8472_ext_cal_unaligned), TEST_CASE(test_module_eeprom_sfp_8472_rx_power_polynomial), + TEST_CASE(test_module_eeprom_sfp_8472_cal_saturate_max), + TEST_CASE(test_module_eeprom_sfp_8472_cal_saturate_min), + TEST_CASE(test_module_eeprom_sfp_8472_cal_round), TEST_CASE(test_module_eeprom_qsfp_8636), TEST_CASE(test_module_eeprom_qsfp_8636_thresholds), TEST_CASE(test_module_eeprom_invalid), -- 2.47.3
