Hi All, I recently posted this month's article on my website www.dsmith.org. It shows how to display measurement error of a current measurement simulataneous to the measurement itself. This method catches almost all of the possible ways error can work its way into the measurement.
The data I used for the measurement discussion also, as a by-product, shows how a common measurement error in Electrical Fast Transient (IEC 61000-4-4) testing can nearly double the stress on I/O leads of the EUT past what the test calls for at a given level. I have seen several test labs make this mistake, after the fact, by examining photos of the test setup in the test report. The error has to do with which end of the capacitive clamp is connected to the EFT generator. It makes a big difference! Doug -- ----------------------------------------------------------- ___ _ Doug Smith \ / ) P.O. Box 1457 ========= Los Gatos, CA 95031-1457 _ / \ / \ _ TEL/FAX: 408-356-4186/358-3799 / /\ \ ] / /\ \ Mobile: 408-858-4528 | q-----( ) | o | Email: d...@dsmith.org \ _ / ] \ _ / Website: http://www.dsmith.org ----------------------------------------------------------- --------- This message is coming from the emc-pstc discussion list. To cancel your subscription, send mail to majord...@ieee.org with the single line: "unsubscribe emc-pstc" (without the quotes). For help, send mail to ed.pr...@cubic.com, jim_bac...@monarch.com, ri...@sdd.hp.com, or roger.volgst...@compaq.com (the list administrators).