If possible, I would suggest to do the test with CDN and do it in a shielded room with all the measuring equipment located outside of the room.
>>> "David Gelfand" <gelf...@memotec.com> 05/25/01 04:06am >>> Joe, The test was done by Nemko Canada using the clamp method. The clamp was calibrated a few hours before my test. The equipment was 10 cm over a ground plane, and they were monitoring the test voltage with a clamp to be sure not to overtest. Is the coupling network a better bet than the clamp? Our card does not have a ground plane and I suspect that this is part of the problem. Also the components for setting impedances could be closer to the chip. But before we scramble to fix the board I'd like to be sure it is possible to do with the AMD component. Their AEs are trying to get me this information, if you could put me in touch with your contact who passed with this chip that could help too. Thanks again for your input. Best regards, David. ------------------------------------------- This message is from the IEEE EMC Society Product Safety Technical Committee emc-pstc discussion list. Visit our web site at: http://www.ewh.ieee.org/soc/emcs/pstc/ To cancel your subscription, send mail to: majord...@ieee.org with the single line: unsubscribe emc-pstc For help, send mail to the list administrators: Michael Garretson: pstc_ad...@garretson.org Dave Heald davehe...@mediaone.net For policy questions, send mail to: Richard Nute: ri...@ieee.org Jim Bacher: j.bac...@ieee.org All emc-pstc postings are archived and searchable on the web at: http://www.rcic.com/ click on "Virtual Conference Hall,"
