The Elusive Glitch - Part 3
This month on http://www.dsmith.org, the Technical Tidbit is the final
Part 3 of the Elusive Glitch story. The first two articles in October
and November talked about how ESD and other impulsive events can disrupt
measurements on digital circuits. Also covered were techniques for
determining when such disruption is occurring.
Part 3 of the Elusive Glitch for December shows how fields from
impulsive events can be accurately measured. This is not a technique
most of us will use in the lab, but standards committees are using such
methods to write new standards that will show up in our design
requirements in the future.
--
-------------------------------------------------------
___ _ Doug Smith
\ / ) P.O. Box 1457
========= Los Gatos, CA 95031-1457
_ / \ / \ _ TEL/FAX: 408-356-4186/358-3799
/ /\ \ ] / /\ \ Mobile: 408-858-4528
| q-----( ) | o | Email: d...@dsmith.org
\ _ / ] \ _ / Website: http://www.dsmith.org
-------------------------------------------------------
-------------------------------------------
This message is from the IEEE EMC Society Product Safety
Technical Committee emc-pstc discussion list.
Visit our web site at: http://www.ewh.ieee.org/soc/emcs/pstc/
To cancel your subscription, send mail to:
majord...@ieee.org
with the single line:
unsubscribe emc-pstc
For help, send mail to the list administrators:
Michael Garretson: pstc_ad...@garretson.org
Dave Heald davehe...@mediaone.net
For policy questions, send mail to:
Richard Nute: ri...@ieee.org
Jim Bacher: j.bac...@ieee.org
All emc-pstc postings are archived and searchable on the web at:
No longer online until our new server is brought online and the old
messages are imported into the new server.
