Right, Self declaration remains the basis of the system, the responsibilities and accreditation requirements are for notified bodies called conformity assessment body
Both EMC and LVD proposals state under point 6(16) and 17 (6/16) The manufacturer, having detailed knowledge of the design and production process, is best placed to carry out the complete conformity assessment procedure for electrical equipment. Conformity assessment should therefore remain the obligation of the manufacturer alone. (17)LVD only: Although conformity assessment should be the responsibility of the manufacturer without any need to involve an independent conformity assessment body, in order to facilitate the completion of the conformity assessment procedure, manufacturers should be allowed to seek assistance of an independent conformity assessment laboratory. Regards, Ing. Gert Gremmen g.grem...@cetest.nl www.cetest.nl Kiotoweg 363 3047 BG Rotterdam T 31(0)104152426 F 31(0)104154953 Before printing, think about the environment. -----Oorspronkelijk bericht----- Van: emc-p...@ieee.org [mailto:emc-p...@ieee.org] Namens Rick Linford Verzonden: vrijdag 17 februari 2012 23:05 Aan: oconne...@tamuracorp.com; EMC-PSTC@LISTSERV.IEEE.ORG Onderwerp: RE: EU NLF directives Hi Brian, I don't recall #10 "Self declaration may no longer be possible for anything scoped by RoHS, LVD, and/or EMCD.", being implied or suggested in anything crossing my disk so far. What sources might you have that may lead me to the same concern? Thanks Rick -----Original Message----- From: Brian Oconnell [mailto:oconne...@tamuracorp.com] Sent: Friday, February 17, 2012 2:47 PM To: EMC-PSTC@LISTSERV.IEEE.ORG Subject: EU NLF directives reference this: <http://ec.europa.eu/enterprise/policies/single-market-goods/regulatory-poli cies-common-rules-for-products/new-legislative-framework/> Doing some reading in prep for RoHS recast reporting. After reading the NLF regs (765/2008, 768/2008) and the proposals for LVD and EMCD recast, and losing much karma through brain leakage, I have summarized these affects: 1. Everyone in the 'chain' is responsible. While all 'economic operators' are said to be responsible, there are some that may not be legally held accountable. 2. Each EU state will have a sole national accreditation body as regulatory and to grant accreditation. 3. The 'CE' mark should be the sole indicator of conformity, and must display (adjacent) the ID of the NB. All NLF-affected stuff shall be serialized and marked with a product identification; shall have instructions; shall have mfr contact info. All languages where placed on market must be addressed for DofC and manual (is Klingon an EU language?). 4. Import fees or some other additional tax will be required to support accreditation and surveillance bodies. 5. All test facilities will have to be accredited to act as a 3d party lab. 6. Any state can submit a 'reasoned request', and the mfr/rep must provide all required data. So all CE-marked electrical stuff must have a TF/TCF and D of C. 7. Mfrs/importers/reps/distributers must determine that the product is compliant. 8. All NBs will be subject to peer review, and the CABs/NBs have some level of liability. 9. ISO 9k/14k factory registration becomes pro forma requirement. 10. Self declaration may no longer be possible for anything scoped by RoHS, LVD, and/or EMCD. 11. All records, including TF, DofC, test records, inspections, et al have 10year retention. Did I miss any important points? Do any of above have incorrect interpretation? Brian - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <emc-p...@ieee.org> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <emcp...@radiusnorth.net> Mike Cantwell <mcantw...@ieee.org> For policy questions, send mail to: Jim Bacher: <j.bac...@ieee.org> David Heald: <dhe...@gmail.com> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <emc-p...@ieee.org> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <emcp...@radiusnorth.net> Mike Cantwell <mcantw...@ieee.org> For policy questions, send mail to: Jim Bacher: <j.bac...@ieee.org> David Heald: <dhe...@gmail.com> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <emc-p...@ieee.org> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <emcp...@radiusnorth.net> Mike Cantwell <mcantw...@ieee.org> For policy questions, send mail to: Jim Bacher: <j.bac...@ieee.org> David Heald: <dhe...@gmail.com>