http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #4 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-30 18:30:40 UTC --- (In reply to comment #0) > Tests gcc/testsuite/gcc.target/arm/neon/v*.c are generated by the script > gcc/config/arm/neon-testgen.ml. 54 of these tests have duplicate > scan-assembler test directives, leading to duplicate lines in the test summary > file. The test generator is an O'Caml program. > > I'm hoping that someone who knows that language will kindly take a look at > this > bug, fix it, and regenerate the tests. I took a quick peek , it's a bit of work to get this done - the problem really is in the way in which we are generating with emit_epilogue - would be nice if one could get a hold of VecArray at this point of time and generate scan-assembler-times the arity .... I don't do enough ML to deal with it right now. Ramana
