On 05/09/12 23:14, Christophe Lyon wrote: > Hello, > > Although the recent optimization I have committed to use Neon vext > instruction for suitable builtin_shuffle calls does not support > big-endian yet, I have written a patch to the existing testcases such > they now support big-endian mode. > > I think it's worth improving these tests since writing the right masks > for big-endian (such that the program computes the same results as in > little-endian) is not always straightforward. > > In particular: > * I have added some comments in a few tests were it took me a while to > find the right mask. > * In the case of the test which is executed, I had to force the > noinline attribute on the helper functions, otherwise the computed > results are wrong in big-endian. It is probably an overkill workaround > but it works :-) > I am going to file a bugzilla for this problem. > > I have checked that replacing calls to builtin_shuffle by the expected > Neon vext variant produces the expected results in big-endian mode, > and I arranged the big-endian masks to get the same results. > > Christophe.= > > > neon-vext-big-endian-tests.patch > > > N¬n‡r¥ªíÂ)emçhÂyhi×¢w^™©Ý >
I'm not sure about this. Looking at the documentation in the manual for builtin_suffle makes no mention of the results/behaviour being endian dependent, which makes me wonder why this test needs to be. R.
