Thanks. Committed with suggested change. Merry Christmas! Bingfeng
-----Original Message----- From: Jakub Jelinek [mailto:ja...@redhat.com] Sent: 23 December 2013 16:48 To: Bingfeng Mei Cc: gcc-patches@gcc.gnu.org Subject: Re: [PATCH] [followup to PR59569] new vect tests for store with negative step On Mon, Dec 23, 2013 at 04:43:17PM +0000, Bingfeng Mei wrote: > Here are two vectorization tests for store with negative step. This is > follow-up to PR59569 fix, which contains two tests for ICE. These tests > are for vectorization tests and executable. OK to commit? --- testsuite/gcc.dg/vect/vect-neg-store-1.c (revision 0) +++ testsuite/gcc.dg/vect/vect-neg-store-1.c (revision 0) @@ -0,0 +1,27 @@ +/* { dg-require-effective-target vect_int } */ +#include <stdlib.h> + +__attribute__((noinline, noclone)) +void test1(short x[128]) +{ + int i; + for (i=127; i>=0; i--) { + x[i] = 1234; + } +} + +int main (void) +{ + short x[128]; + int i; + test1 (x); + + for (i = 0; i < 128; i++) + if (x[i] != 1234) + abort (); Can you please change both tests so that the x array is say 128+32 elements long instead of 128, you store some other pattern to the first 16 and last 16 elements in the array before calling test1 (do it say with asm (""); inside of the loop to avoid vectorization), call test1 on x + 16 and afterwards verify that test1 didn't write anything before or after the buffer? Ok with that change. Jakub
patch_vect_tests
Description: patch_vect_tests