Laser spot is not the only IRT technique for proper crack detection. UET 
has also been evaluated for this task [130]. This evaluation concludes that 
UET can effectively detect closed cracks considered undetectable by 
traditional NDT methods, including optically-stimulated IRT. Thanks to its 
large area imaging capability, high test productivity and safety, 
ultrasound IRT is a powerful NDT tool for the inspection of cracks in large 
aluminum structures. Its disadvantage is the requirement of a coupling 
element.

The only conclusion I can come up with was that it overheated and cracked, 
while charging. My iPhone 8plus was also charging when it cracked inside a 
protected case with absolutely nothing that could get to it in order to 
crack it
matlab 2014a crack only 14

*DOWNLOAD* https://cinurl.com/2wHcFO


I would have not believed a screen could break without dropping it either 
but it happened to me too. I put the phone on the charger overnight on the 
floor beside the plug in between the bed and the wall. The phone was the 
only thing on the floor where it could not even be reached except by your 
hand as nothing else could fit there. Yet, somehow when I retrieved it this 
morning, the screen was cracked inside an otter box case.

Finished solar cells are occasionally found to be defective or faulty. The 
defects fall into two groups: (i) intrinsic and (ii) extrinsic. Grain 
boundaries are an example of intrinsic defect, while micro-cracks belong to 
the second category. The former type of defects diminish the short-circuit 
current of the cell, and this leads to loss in the efficiency. The latter 
defects form a class of cracks that are entirely invisible to the naked 
eye. With dimensions smaller than 30 μm [2], this type of defect can only 
be visualized electronically like using the electroluminescence (EL) 
technique and high-resolution cameras.

In practice, there are various shapes and sizes of micro-cracks in a solar 
cell depending on how they are formed. For example a line-shaped 
micro-crack is caused by scratches, and it generally occurs during cell 
fabrication [3]. This type of defect can also be due to wafer sawing or 
laser cutting, which propagates and causes the detachment or internal 
breakage of the grainy materials within the solar cells [4]. In contrast, 
star-shaped micro-crack is formed due to a sharp point impact which induces 
several line cracks with a tendency to cross each other [5]. There are 
other types of micro-crack defects, but these two are the most commonly 
found in solar cell production. Köntges et al. [6] reported that there may 
be a risk of failure for PV modules containing cells that have micro-cracks 
or other types of defects. Hence, it is important to have high-quality, 
defect-free cells in the production of PV modules.

For the thoroughness of analysis, the proposed segmentation technique is 
compared with standard methods such as Otsu's thresholding, the Canny 
hysteresis, the Sobel edge detector, and the Laplacian of Gaussian (LoG) 
filter. In addition, a recent method based on Fourier image reconstruction 
(FIR) [9] is also implemented. Figure 15 shows the close-up view of the 
results of these different segmentation techniques using images in Figure 
14a (i-iv) as input images. In this case, the ground truth images are 
plotted manually by an expert human inspector. It can be seen from Figure 
15b that the segmentation using Otsu's global thresholding technique is 
able to detect micro-crack as well as other pixels. Meanwhile, both the 
Sobel detector and Canny hysteresis thresholding resulted in incomplete or 
disjointed micro-crack pixels. On the other hand, the LoG is only effective 
in detecting a limited number of micro-crack pixels, particularly the large 
ones as evident from Figure 15e. In contrast, the FIR method is accurate 
when detecting well-defined micro-crack pixels especially the ones 
appearing like straight lines. This method failed to completely detect 
star-shaped micro-crack pixels as evident from Figure 15f. In contrast, the 
results from the proposed segmentation technique are shown in Figure 15g. 
Clearly, the proposed method is able to detect all shapes and sizes of 
micro-crack pixels in the image. Close examination of this figures revealed 
that some unwanted pixels also appeared in the segmented images. They are 
mostly due to the presence of dark regions in the solar cell. Since their 
appearance are distinctly different from micro-crack pixels, the use of the 
ART shape descriptor helped reduce the error resulting from misdetection.

The cpt and crt indices calculated from defected cell images in Figure 15 
are tabulated in Table 1. These indices are also calculated for the 
remaining 110 defected cells which are not shown in this paper. The average 
values are listed in the last column of Table 1. Referring to this table, 
the completeness of Otsu's method is the highest compared to other 
algorithms. But this is not the case for correctness as the crt index for 
this algorithm is the second lowest. Consequently, Otsu's method 
reconstructs many micro-crack pixels as well as noise as evident visually 
in the examples in Figure 15. As expected, the Sobel edge detection and 
Canny hysteresis methods produce only average results for both completeness 
and correctness. The same trend is observed for the FIR method. In 
contrast, the LoG filter produces the lowest cpt and crt scores, suggesting 
that this method does not correctly or completely detect micro-crack 
pixels. Meanwhile, the proposed segmentation technique yields the highest 
crt and the second highest cpt scores. This result suggests that this 
method has the ability to completely and correctly characterize micro-crack 
with small amount of noise.

Shape analysis is performed in order to primarily distinguish between 
micro-crack and other arbitrary pixels. This is due to the fact that the 
micro-crack pixels form shapes which are visually distinct like line or 
star patterns. On the other hand, shapes formed by the spurious intensity 
variation or gray level discontinuities produce arbitrarily patterns which 
are also detected by the proposed image processing algorithm. In doing so, 
the ART shape descriptor discussed earlier in Section 2.4 is implemented. 
The algorithm is evaluated using 114 defected and 126 intact cells. 
Altogether, 5,598 shapes have been detected of which 218 belong to the 
micro-crack category and the remaining are arbitrary patterns. The ART is 
applied to these shapes, and the results are visualized in principal 
component plots in Figure 20a. In this case, only the first two dominant 
components, i.e., first and second components, are used in the 
visualization.

In the present work, an image processing model that automatically detects 
and analyzes cracks on the surfaces of building elements in the digital 
image is established. The proposed model does not only automatically 
recognize crack pixels out of image background but also perform various 
measurements of crack characteristics including the area, perimeter, width, 
length, and orientation. At the center of the proposed model, an image 
enhancement algorithm called Min-Max Gray Level Discrimination (M2GLD) is 
put forward as a preprocessing step to improve the Otsu binarization 
approach, followed by shape analyses for meliorating the crack detection 
performance. The crack detected by the proposed approach was compared with 
that acquired by the conventional technique. The experimental results show 
that the crack on various structure surfaces can be accurately recognized 
and analyzed using the proposed image processing model. The paper is 
organized as follows: the next section reviews previous works pertinent to 
the current study; the third section describes the improved Otsu method 
based on the M2GLD, followed by the proposed image processing model for the 
detection of surface crack; the model experimental results are reported in 
the fifth section; and the final section provides some conclusions of the 
study.

- *April 4, 2022:* Yet some more bug fixes by Andreas Wank. 
- *March 2, 2022:* Some bug fixes by Andreas Wank. 
- *August 17, 2019:* Support up to Matlab R2019a(beta). Simulink model 
warnings fixed by Behnam Tamimi. 
- *June 7, 2016:* Support for Matlab R2016a(beta). Several GUIs' bugs have 
been fixed by Hantao Cui. 
- *May 26, 2016:* PSAT version 2.1.10. Compatible with Matlab R2014b, 
R2015a and R2015b. Some bugs have been fixed. 
- *September 6, 2014:* PSAT version 2.1.9. PSAT Documentation available for 
purchase. Compatible with Matlab R2014a and syntax consolidation. Fixed a 
few bugs. 
- *January 6, 2013:* PSAT version 2.1.8. Added 2 compact solar 
photo-voltaic generator models (thanks to B. Tamimi and C. Cañizares). 
Fixed a few bugs. 
- *July 30, 2012:* PSAT version 2.1.7. Compatible with Matlab 7.14 
(R2012a). Added 4 hydro turbine models (thanks to W. Li and L. Vanfretti). 
Fixed the exponential recovery load model and several other bugs. 
- *May 13, 2010:* PSAT version 2.1.6. Yet another minor release. Compatible 
with Matlab 7.10 (R2010a). 
- *November 1, 2009:* PSAT version 2.1.5. Yet another minor release. 
- *June 17, 2009:* PSAT version 2.1.4. Minor release that fixes a few bugs. 
- *April 21, 2009:* PSAT version 2.1.3. Minor release that consolidates 
device classes and fixes several bugs. 
- *June 26, 2008:* PSAT version 2.1.2. Minor release that fixes some bugs 
in the CPF analysis. 
- *June 18, 2008:* PSAT version 2.1.1. Minor release that fixes a bug in 
the AVR class. 
- *June 16, 2008:* PSAT version 2.1.0. PSAT can run on any Matlab version 
back to 5.3 and on GNU Octave. The GUI for 3D visualization for static and 
dynamic power system analyses has been completed. The library for Numerical 
Linear Analysis has been completely rewritten and split into a Linear 
Analysis library and a Numerical Differentiation library. A filter for the 
ODM (open data model) has been included. The GUIs have been optimized for 
running on Quartz (Mac OS X) and X11 (Linux) graphical systems. 
- *February 2, 2008:* PSAT version 2.0.0. The whole PSAT code has been 
rethinked and rewritten using classes and object oriented programming 
techniques. Each device is defined by a class with attributes and methods. 
The algorithms of PF, CPF, OPF, SSSA and TD have been rewritten, improved 
and made more robust. The Simulink library has been renewed using 
"physical" components. This avoids the directionality of control blocks and 
allows producing high quality network schemes. Added the status field to 
most components. A component can be put on-line or off-line by toggling its 
status. New more reliable versions of TCSC, SSSC and UPFC devices and Power 
Oscillations damper model has been provided by H. Ayres, M. S. Castro and 
A. Del Rosso. The HVDC model has also been rewritten. Several new filters 
for data format conversion have been added. Most filters has been provided 
by J. C. Morataya. PSAT has been tested with very large static and dynamic 
networks (up to 15000 buses). The logo of PSAT has been changed. 
- *November 20, 2007:* PSAT version 2.0.0 beta 4. Fully class-based 
version. 3D visualization of power systems. Several components and models 
have been completely revised and rewritten. This is an almost stable 
version and is only compatible with Matlab 7.0 or newer (no GNU/Octave 
compatibility). 
- *March 8, 2007:* PSAT version 2.0.0 beta 3 . This is still a development 
version and is only compatible with Matlab 7.0 or newer (at the moment this 
version is NOT compatible with Octave). Further class development. Several 
improvements. 
- *December 14, 2006:* PSAT version 2.0.0 beta 2. This is a development 
version and is only compatible with Matlab 7.0 or newer (at the moment this 
version is NOT compatible with Octave). Further class development. 
Introduced the connection status for several comments. Several improvements. 
- *March 24, 2006:* PSAT version 2.0.0 beta 1. This is a development 
version and is only compatible with Matlab 7.0 or newer (at the moment this 
version is NOT compatible with Octave). First version of PSAT which uses 
classes. New more reliable FACTS models and new Power Oscillation Damper 
model for FACTS devices (by H. Ayres, M. S. Castro and A. Del Rosso). New 
Simulink library with physical components. New filters for data format 
conversion (by J. C. Morataya). Improved PF, CPF, OPF, SSSA and TD 
algorithms. Tested on a 15000 bus network. 
- *July 14, 2005:* PSAT version 1.3.4. Added multiperiod market clearing 
model for the PSAT-GAMS interface and many other improvements. 
- *January 26, 2005:* PSAT version 1.3.3. Minor release with a few 
bug-fixes and a revised documentation. 
- *October 8, 2004:* PSAT version 1.3.2. First version tested on Matlab 7 
(R14). New Physical Model Component (PMC) Simulink Library. Several bug 
fixes and improvements. 
- *August 2, 2004:* PSAT version 1.3.1. Numeric Linear Analysis library by 
Alberto del Rosso. New model for direct drive synchronous generator wind 
turbine. PSS/E 29 filter. Several bug fixes and improvements. 
- *May 2, 2004:* PSAT version 1.3.0. Added a command line version and basic 
compatibility with GNU/Octave. New wind turbine models and bus frequency 
measurement. Several bug fixes and improvements. 
- *November 25, 2003:* PSAT version 1.2.2. Several bug fixes and 
improvements. Added utilities to convert data files into BPA format and to 
export PF results to MS Excel sheets and to LaTeX tables. 
- *September 11, 2003:* PSAT version 1.2.1. Includes previous patch and 
several other bug fixes. 
- *August 31, 2003:* PSAT version 1.2.0. Matlab version independent. 
Several bugs and typos were removed thanks to Liulin. 
- *August 16, 2003:* Created the PSAT Forum (available at ). 
- *August 1, 2003:* PSAT version 1.1.0. Many addings (GAMS and UWPFLOW 
interfaces, phase shifting transformer, etc.), improvements and bugs fixing. 
- *November 11, 2002:* PSAT version 1.0.0. 

eebf2c3492

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