Dear All, I am currently working on the crystallization behavior of multi-component amorphous oxides, where the formation of various complex nanocrystals has been observed upon heat treatment. Based on TEM-EDS analysis, it appears that these crystals are likely solid solutions containing multiple elements. The corresponding XRD patterns can be indexed using standard structure types available in the ICSD database.
I am aiming to quantify the phase fractions using GSAS-II software. In this context, I would appreciate some guidance on the following: - Should I use the standard ICSD CIF files directly for the refinement, or is it necessary to modify the CIFs to reflect the compositions obtained from TEM-EDS? - In preliminary refinements, I have noticed intensity mismatches, particularly for acicular-shaped crystals. Could this be related to preferred orientation effects or other microstructural factors? Any insights or suggestions on how to approach this would be greatly appreciated. Thank you and best regards Angshuman Gupta Research scholar Metallurgical Engineering and Materials Science Department Indian Institute of Technology Bombay.
_______________________________________________ GSAS-II mailing list [email protected] https://mailman.aps.anl.gov/mailman/listinfo/gsas-ii
