dev-work-8103 commented on code in PR #7593:
URL: https://github.com/apache/hbase/pull/7593#discussion_r2678404005
##########
hbase-server/src/test/java/org/apache/hadoop/hbase/regionserver/compactions/TestCustomCellTieredCompactor.java:
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@@ -74,6 +77,9 @@ public void tearDown() throws Exception {
@Test
public void testCustomCellTieredCompactor() throws Exception {
+
utility.getConfiguration().setInt("hbase.hfile.compaction.discharger.interval",
10);
+ utility.startMiniCluster();
+
Review Comment:
To handle different configurations across test methods, I've adopted the
pattern used in TestColumnFamilyDescriptorDefaultVersions.
1. The setUp() method initializes HBaseTestingUtil and starts the mini
cluster with the default CustomCellTieringValueProvider configuration.
2. testCustomCellTieredCompactor() executes using this default configuration.
3. testCustomCellTieredCompactorWithRowKeyDateTieringValue() shuts down the
mini cluster, reconfigures it with 4. RowKeyDateTieringValueProvider, and
restarts before executing its test logic.
The tearDown() method ensures proper cleanup after each test.
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