On 2020-07-08 14:21, Ondřej Jirman wrote:
[...]
@@ -523,10 +547,17 @@ static int sun8i_ths_probe(struct platform_device *pdev)
ret = devm_request_threaded_irq(dev, irq, NULL,
sun8i_irq_thread,
IRQF_ONESHOT, "ths", tmdev);
- if (ret)
- return ret;
+ if (ret) {
+ dev_err(dev, "Failed to request irq (%d)\n", ret);
+ goto err_out;
+ }
+ dev_info(dev, "Thermal sensor ready!\n");
return 0;
+
+err_out:
+ dev_err(dev, "Failed to probe thermal sensor (%d)\n", ret);
When the driver fails, there will be this print. Isn't it superfluous
for you to add these？
sun8i-thermal: probe of 5070400.thermal-sensor failed with error
There's no such failure message in the case I investigated, which is
EPROBE_DEFER failure waiting for nvmem driver that never loads,
because it's not configured by the user to build.
Ah, in that case this was a bit misleading, since "probe failure" isn't
really the problem at all. As it happens, there's a whole other
discussion ongoing around making probe deferral issues easier to debug:
https://lore.kernel.org/linux-arm-kernel/20200626100103.18879-1-a.ha...@samsung.com/
Robin.
