Problem:
adm1272 and adm1278 supports temperature sampling. The
current way of enabling it requires the user manually unbind the device
from the driver, flip the temperature sampling control bit and then bind
the device back to the driver. It would be nice if we can control this in a
better way by reading the dt.
Solution:
Introducing device tree binding adm1272-adm1278-temp1-en. If the
flag is set, flip the temp1_en control bit on probing.
Testing:
make dt_binding_check
Signed-off-by: Chu Lin <linchuy...@google.com>
---
Documentation/devicetree/bindings/hwmon/adm1275.txt | 3 +++
1 file changed, 3 insertions(+)
diff --git a/Documentation/devicetree/bindings/hwmon/adm1275.txt
b/Documentation/devicetree/bindings/hwmon/adm1275.txt
index 1ecd03f3da4d..4403fe30f005 100644
--- a/Documentation/devicetree/bindings/hwmon/adm1275.txt
+++ b/Documentation/devicetree/bindings/hwmon/adm1275.txt
@@ -15,6 +15,8 @@ Optional properties:
- shunt-resistor-micro-ohms
Shunt resistor value in micro-Ohm
+- adm1272-adm1278-temp1-en
+ Enable temperature sampling. This is supported on adm1272 and adm1278
Example:
@@ -22,4 +24,5 @@ adm1272@10 {
compatible = "adi,adm1272";
reg = <0x10>;
shunt-resistor-micro-ohms = <500>;
+ adm1272-adm1278-temp1-en;
};
--
2.27.0.383.g050319c2ae-goog
