For ONFI-compliant NAND devices, the ONFI parameters report the maximum number of bad blocks per LUN that will be encountered over the lifetime of the device, so we can use that information to get a more accurate (and smaller) value for the UBIFS bad PEB limit.
These patches are ordered in terms of their dependencies, but ideally, all 3 would need to be applied for this to work as intended. Jeff Westfahl (3): mtd: introduce function max_bad_blocks mtd: nand: implement 'max_bad_blocks' mtd function mtd: ubi: use 'max_bad_blocks' to compute bad_peb_limit drivers/mtd/mtdpart.c | 12 ++++++++++++ drivers/mtd/nand/nand_base.c | 35 +++++++++++++++++++++++++++++++++++ drivers/mtd/ubi/build.c | 10 ++++++++++ include/linux/mtd/mtd.h | 1 + 4 files changed, 58 insertions(+) -- 2.4.0 -- To unsubscribe from this list: send the line "unsubscribe linux-kernel" in the body of a message to majord...@vger.kernel.org More majordomo info at http://vger.kernel.org/majordomo-info.html Please read the FAQ at http://www.tux.org/lkml/
