This may be a stupid question, but I’m working with
materials (chipped stone artifacts) that are pretty fragile, and in some cases
the left or right side of the tool has been broken. These were typically symmetrical, so I’m trying to figure
out if it’s possible (and if so, how) to reflect points from one intact side
(left) to produce a bilateral set of points for analysis. I’m using the
tps programs for digitization,
and MorphoJ for analysis. Is this possible in either software
package? If there’s a guide out that that I’ve missed, I’d
love a link to it to save someone the effort of otherwise trying to
explain. Thanks!
----- Forwarded message from
"Bissett, Thaddeus Geoffrey"
Date: Thu, 18
Oct 2012 10:04:25 -0400
From: "Bissett, Thaddeus Geoffrey"
Reply-To: "Bissett, Thaddeus Geoffrey"
Subject: RE: Reflecting points from one side to
produce bilaterallysymmetric landmarks... how?
To:
"[email protected]"
----- End forwarded message
-----
