Call for Submissions and Participation DATE 2008 Friday Workshop on Impact of Process Variability on Design and Test
ICM, Munich, Germany, Friday, March 14, 2008. http://www.date-conference.com/conference/2008/prog/progdetail.php?progid=W2 Abstract submission deadline: March 1, 2008. Early registration deadline: February 20, 2008. WORKSHOP DESCRIPTION Integrated circuit technology continues to shrink. Mainstream semiconductors are starting to be produced at the 45nm technology node, where transistors and wires measure less than 100 atoms across. The discrepancies between lithography wavelengths and circuit feature sizes increase. Lower power supply levels and increasing operating speeds significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is increasingly difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Process variation cannot be solved by improving manufacturing tolerances. Variability must be reduced by new device technology or managed by design in order for scaling to continue. Within-die performance variation also imposes new challenges for test methods. Test hardware must be embedded in the design to detect errors dynamically, isolate and confine faults, reconfigure the system to work around faults using spare hardware, and recover from errors on the fly. This will become increasingly important as devices experience parametric degradation over time, requiring run-time reconfiguration. This workshop will provide a forum for researchers from industry and academia where the latest results can be presented and ideas exchanged between those working on different approaches to dealing with variability. The scope of this workshop covers all aspects of process variation. At the transistor level, this includes new devices to replace CMOS in order to reduce variability, and the modelling of transistor devices at atomic scales so variation can be understood. From the viewpoint of fabrication technology, new techniques and CAD tools for predicting and compensating for the effect of variability in processes are of interest. At the circuit and system level, tools and design methods must be aware of variation, without adding extra complexity that renders design intractable. Process variation-aware test and reliability methods together with various design techniques that allow circuits and systems to adapt variability are also of particular relevance. By bringing together researchers from different areas of expertise, this workshop aims to encourage collaborative research that tackles the problems of process variation from several levels simultaneously. PROGRAM AND PARTICIPATION The workshop includes seven very interesting invited talks - however a significant part of the workshop will be based around poster presentations, to maximise the opportunities for discussion and interaction amongst all participants. There will be two one-hour sessions during the workshop for poster presentations. The format of the posters will be A0 portrait. A title and a brief abstract of the poster should be sent to Gert Jervan ([EMAIL PROTECTED]), Mladen Berekovic ([EMAIL PROTECTED]) or Pete Sedcole ([EMAIL PROTECTED]). Participation requires registration and a registration fee. Discounted registration is available through the DATE'08 web site only until February 20, 2008. Full-fee registration will also be possible on-site in Munich, Germany. For more information see: http://www.date-conference.com/conference/2008/prog/progdetail.php?progid=W2 Please feel free to forward this on to anyone who you believe may be interested. Gert Jervan ([EMAIL PROTECTED]) Mladen Berekovic ([EMAIL PROTECTED]) Pete Sedcole ([EMAIL PROTECTED]) _________________________________________________________________________________ mozart-users mailing list [email protected] http://www.mozart-oz.org/mailman/listinfo/mozart-users
