Bill Havanki created ACCUMULO-2849: -------------------------------------- Summary: Add scan batch size configurability and write delay to memory stress test Key: ACCUMULO-2849 URL: https://issues.apache.org/jira/browse/ACCUMULO-2849 Project: Accumulo Issue Type: Improvement Components: test Reporter: Bill Havanki Assignee: Bill Havanki Priority: Minor Fix For: 1.5.2, 1.6.1, 1.7.0
I had the opportunity to work with the memory stress tool created under ACCUMULO-2789. Two features which I added to help the tests along would be helpful: # Allowing the scanner batch size to be configured, to reduce memory demand when fetching very large keys or values # Adding a configurable write delay, to reduce pressure on tablet servers to minor compact. -- This message was sent by Atlassian JIRA (v6.2#6252)