Bill Havanki created ACCUMULO-2849:
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Summary: Add scan batch size configurability and write delay to
memory stress test
Key: ACCUMULO-2849
URL: https://issues.apache.org/jira/browse/ACCUMULO-2849
Project: Accumulo
Issue Type: Improvement
Components: test
Reporter: Bill Havanki
Assignee: Bill Havanki
Priority: Minor
Fix For: 1.5.2, 1.6.1, 1.7.0
I had the opportunity to work with the memory stress tool created under
ACCUMULO-2789. Two features which I added to help the tests along would be
helpful:
# Allowing the scanner batch size to be configured, to reduce memory demand
when fetching very large keys or values
# Adding a configurable write delay, to reduce pressure on tablet servers to
minor compact.
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