Quoting John Francis <[EMAIL PROTECTED]>: > But, in any case, that's not the right formula to use. The correct way > to ask the question is, roughly speaking: > > "If defects show up approximately once every N square mm of silicon, > what is the chance of getting an error in a component that covers > an area of M square mm" ?
That question assumes that errors are randomly distributed across the wafer. I don't know about those things, but have a gut feeling that error probablilty might be higher at the edge of the wafer... Will be happy to be proven wrong, though...:-) Cheers, Jostein ---------------------------------------------------------------- This message was sent using IMP, the Internet Messaging Program.
