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CALL FOR PAPERS DATE 2015
Topic: E3 Model-based Design and Verification for Embedded Systems
DATE (Design, Automation & Test in Europe) Conference
Grenoble, France, 9-13 March, 2015
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DEADLINES
- Paper Submission: Sunday, September 14, 2014
- Notification of Acceptance: Friday, November 07, 2014
- Camera-Ready Paper: Friday, November 28, 2014
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QUICK LINKS
- Conference http://www.date-conference.com
- Call for Papers http://www.date-conference.com/call-for-papers
- Instructions http://www.date-conference.com/submission-instructions
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The Design, Automation and Test in Europe conference and
exhibition is the main European event bringing together designers
and design automation users, researchers and vendors, as well as
specialists in the hardware and software design, test and
manufacturing of electronic circuits and systems.
This five-day event consists of a conference with
plenary keynotes, regular papers, interactive presentations,
panels and hot-topic sessions, tutorials, master courses and
workshops. The scientific conference is complemented by a
commercial exhibition showing the state-of-the-art in design and
test tools, methodologies, IP and design services. Both the
conference and the exhibition, together with the many user group
meetings, fringe meetings, university booth and social events
offer a wide variety of opportunities to meet and exchange
information.
You are invited to submit your research contributions to the topic
E3 Model-based Design and Verification for Embedded Systems
which is devoted to:
- Verification techniques for embedded systems ranging from
simulation, testing, model-checking, SAT and SMT-based reasoning,
compositional analysis and analytical methods.
- Modeling, analysis and optimization of non-functional and performance
aspects such as timing, memory usage, QoS and reliability.
- Model-based design of software architectures and deployment.
- Theories, languages and tools supporting model-based design flows
covering software, control and physical components.
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E3 Topic Program Committee:
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Saddek Bensalem, Université Joseph Fourier/Verimag, France (Chair)
Linh Thi Xuan Phan, University of Pennsylvania, USA (Co-Chair)
Borzoo Bonakdarpour, University of Waterloo, Canada
Petru Eles, Linköping University, Sweden
Alain Girault, INRIA, France
Oleg Sokolsky, University of Pennsylvania, USA
Wang Yi, Uppsala University, Sweden
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