On 7/7/26 08:09, Jamin Lin wrote:
AST2700 supports a Data FIFO mode where flash accesses can be performed
directly through Data FIFO MMIO offsets. The Data FIFO start offset
increments by one for every 16MB of flash address space, allowing the
chip select (CS) to be decoded from the Data FIFO offset.
This change adds Data FIFO support to the Aspeed SMC model and introduces
a class callback to translate Data FIFO offsets into CS indices. For
AST2700, the Data FIFO offset is matched against the segment start address
of each CS to determine the target flash device.
The SMC register region size (nregs) is also extended dynamically
based on the number of supported chip selects to cover all possible
Data FIFO regions.
Signed-off-by: Jamin Lin <[email protected]>
---
include/hw/ssi/aspeed_smc.h | 3 +-
hw/ssi/aspeed_smc.c | 113 +++++++++++++++++++++++++++++++++---
2 files changed, 107 insertions(+), 9 deletions(-)
I am looking for a way to test "Data FIFO-based flash access".
A qtest extension of the ast2700 smc test would be nice to have.
Is the latest SDK kernel using this feature ?
Thanks,
C.
