On Apr 15 15:26, Philippe Mathieu-Daudé wrote: > On 4/15/20 3:20 PM, Klaus Birkelund Jensen wrote: > > > > I'll get the v1.3 series ready next. > > > > Cool. What really matters (to me) is seeing tests. If we can merge tests > (without multiple namespaces) before the rest of your series, even better. > Tests give reviewers/maintainers confidence that code isn't breaking ;) >
The patches that I contribute have been pretty extensively tested by various means in a "host setting" (e.g. blktests and some internal tools), which really exercise the device by doing heavy I/O, testing for compliance and also just being mean to it (e.g. tripping bus mastering while doing I/O). Don't misunderstand me as trying to weasel my way out of writing tests, but I just want to understand the scope of the tests that you are looking for? I believe (hope!) that you are not asking me to implement a user-space NVMe driver in the test, so I assume the tests should varify more low level details?
