Test EXECUTE and EXECUTE RELATIVE LONG with relative long instructions as targets.
Signed-off-by: Ilya Leoshkevich <i...@linux.ibm.com> --- tests/tcg/s390x/Makefile.target | 1 + tests/tcg/s390x/ex-relative-long.c | 159 +++++++++++++++++++++++++++++ 2 files changed, 160 insertions(+) create mode 100644 tests/tcg/s390x/ex-relative-long.c diff --git a/tests/tcg/s390x/Makefile.target b/tests/tcg/s390x/Makefile.target index cf93b966862..90bc48227db 100644 --- a/tests/tcg/s390x/Makefile.target +++ b/tests/tcg/s390x/Makefile.target @@ -29,6 +29,7 @@ TESTS+=clst TESTS+=long-double TESTS+=cdsg TESTS+=chrl +TESTS+=ex-relative-long cdsg: CFLAGS+=-pthread cdsg: LDFLAGS+=-pthread diff --git a/tests/tcg/s390x/ex-relative-long.c b/tests/tcg/s390x/ex-relative-long.c new file mode 100644 index 00000000000..4caa8c1b962 --- /dev/null +++ b/tests/tcg/s390x/ex-relative-long.c @@ -0,0 +1,159 @@ +/* Check EXECUTE with relative long instructions as targets. */ +#include <stdlib.h> +#include <stdio.h> + +struct test { + const char *name; + long (*func)(long reg, long *cc); + long exp_reg; + long exp_mem; + long exp_cc; +}; + +/* + * Each test sets the MEM_IDXth element of the mem array to MEM and uses a + * single relative long instruction on it. The other elements remain zero. + * This is in order to prevent stumbling upon MEM in random memory in case + * there is an off-by-a-small-value bug. + * + * Note that while gcc supports the ZL constraint for relative long operands, + * clang doesn't, so the assembly code accesses mem[MEM_IDX] using MEM_ASM. + */ +long mem[0x1000]; +#define MEM_IDX 0x800 +#define MEM_ASM "mem+0x800*8" + +/* Initial %r2 value. */ +#define REG 0x1234567887654321 + +/* Initial mem[MEM_IDX] value. */ +#define MEM 0xfedcba9889abcdef + +/* Initial cc value. */ +#define CC 0 + +/* Relative long instructions and their expected effects. */ +#define FOR_EACH_INSN(F) \ + F(cgfrl, REG, MEM, 2) \ + F(cghrl, REG, MEM, 2) \ + F(cgrl, REG, MEM, 2) \ + F(chrl, REG, MEM, 1) \ + F(clgfrl, REG, MEM, 2) \ + F(clghrl, REG, MEM, 2) \ + F(clgrl, REG, MEM, 1) \ + F(clhrl, REG, MEM, 2) \ + F(clrl, REG, MEM, 1) \ + F(crl, REG, MEM, 1) \ + F(larl, (long)&mem[MEM_IDX], MEM, CC) \ + F(lgfrl, 0xfffffffffedcba98, MEM, CC) \ + F(lghrl, 0xfffffffffffffedc, MEM, CC) \ + F(lgrl, MEM, MEM, CC) \ + F(lhrl, 0x12345678fffffedc, MEM, CC) \ + F(llghrl, 0x000000000000fedc, MEM, CC) \ + F(llhrl, 0x123456780000fedc, MEM, CC) \ + F(lrl, 0x12345678fedcba98, MEM, CC) \ + F(stgrl, REG, REG, CC) \ + F(sthrl, REG, 0x4321ba9889abcdef, CC) \ + F(strl, REG, 0x8765432189abcdef, CC) + +/* Test functions. */ +#define DEFINE_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \ + static long test_ex_ ## insn(long reg, long *cc) \ + { \ + register long reg_val asm("r2"); \ + long cc_val, mask, target; \ + \ + reg_val = reg; \ + asm("xgr %[cc_val],%[cc_val]\n" /* initial cc */ \ + "lghi %[mask],0x20\n" /* make target use %r2 */ \ + "larl %[target],0f\n" \ + "ex %[mask],0(%[target])\n" \ + "jg 1f\n" \ + "0: " #insn " %%r0," MEM_ASM "\n" \ + "1: ipm %[cc_val]\n" \ + : [cc_val] "=&r" (cc_val) \ + , [mask] "=&r" (mask) \ + , [target] "=&r" (target) \ + , [reg_val] "+&r" (reg_val) \ + : : "cc", "memory"); \ + reg = reg_val; \ + *cc = (cc_val >> 28) & 3; \ + \ + return reg_val; \ + } + +#define DEFINE_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \ + static long test_exrl_ ## insn(long reg, long *cc) \ + { \ + register long reg_val asm("r2"); \ + long cc_val, mask; \ + \ + reg_val = reg; \ + asm("xgr %[cc_val],%[cc_val]\n" /* initial cc */ \ + "lghi %[mask],0x20\n" /* make target use %r2 */ \ + "exrl %[mask],0f\n" \ + "jg 1f\n" \ + "0: " #insn " %%r0," MEM_ASM "\n" \ + "1: ipm %[cc_val]\n" \ + : [cc_val] "=&r" (cc_val) \ + , [mask] "=&r" (mask) \ + , [reg_val] "+&r" (reg_val) \ + : : "cc", "memory"); \ + reg = reg_val; \ + *cc = (cc_val >> 28) & 3; \ + \ + return reg_val; \ + } + +FOR_EACH_INSN(DEFINE_EX_TEST) +FOR_EACH_INSN(DEFINE_EXRL_TEST) + +/* Test definitions. */ +#define REGISTER_EX_EXRL_TEST(ex_insn, insn, _exp_reg, _exp_mem, _exp_cc) \ + { \ + .name = #ex_insn " " #insn, \ + .func = test_ ## ex_insn ## _ ## insn, \ + .exp_reg = (long)(_exp_reg), \ + .exp_mem = (long)(_exp_mem), \ + .exp_cc = (long)(_exp_cc), \ + }, + +#define REGISTER_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \ + REGISTER_EX_EXRL_TEST(ex, insn, exp_reg, exp_mem, exp_cc) + +#define REGISTER_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \ + REGISTER_EX_EXRL_TEST(exrl, insn, exp_reg, exp_mem, exp_cc) + +static const struct test tests[] = { + FOR_EACH_INSN(REGISTER_EX_TEST) + FOR_EACH_INSN(REGISTER_EXRL_TEST) +}; + +/* Loop over all tests and run them. */ +int main(void) +{ + const struct test *test; + int ret = EXIT_SUCCESS; + long reg, cc; + size_t i; + + for (i = 0; i < sizeof(tests) / sizeof(tests[0]); i++) { + test = &tests[i]; + mem[MEM_IDX] = MEM; + cc = -1; + reg = test->func(REG, &cc); +#define ASSERT_EQ(expected, actual) do { \ + if (expected != actual) { \ + fprintf(stderr, "%s: " #expected " (0x%lx) != " #actual " (0x%lx)\n", \ + test->name, expected, actual); \ + ret = EXIT_FAILURE; \ + } \ +} while (0) + ASSERT_EQ(test->exp_reg, reg); + ASSERT_EQ(test->exp_mem, mem[MEM_IDX]); + ASSERT_EQ(test->exp_cc, cc); +#undef ASSERT_EQ + } + + return ret; +} -- 2.39.2