stevomitric commented on PR #58693:
URL: https://github.com/apache/spark/pull/58693#issuecomment-5634646752

   Fix now, added a vectorized-reader test that reads a foreign INT96 carrying 
sub-microsecond digits. It covers both NTZ and LTZ, dictionary on/off, plus the 
EXCEPTION-rebase case. `putInt96AsNanos` is now tested end-to-end through the 
default reader, not just the row-based unit tests.


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