AlanCoelho wrote:
I would like to conclude that to be critical of a method such as the convolution approach to describing instrument line profiles it would serve authors best to first investigate the approach rather than to be critical of it without substance.
Amen!
I'm really impressed with how well the convolution method has done. Without any way to test it, I've always had to accept the ray-tracers argument that they did better. I all knew is that convolution did well enough. You have shown that it makes no real difference.
Would it be possible for you to generate the data points for the same set of parameters with peaks at 5 and 10 degrees? That way the asymmetry will be really pronounced and the convolution method will be even more stressed. I don't expect it to make any difference, but I'd like to see it on the screen.
Thanks, Larry
