Dear Rietvelds,
I’d appreciate some advice related to precision lattice parameter calculation:
I am currently performing in-situ measurements on a powder sample which is
deposited onto an aluminum mesh support. Due to the setup a 3-axis stage is
used to ‘align’ the sample in the diffractometer, however my optimization of
the sample alignment has simply been done to maximize my signal to noise ratio.
My question then becomes… is it feasible/reliable to utilize the aluminum peaks
(or even the beryllium peaks from my in-situ cell window) from my support as an
internal standard ?? (even though that itself is not in the same plane as my
sample)
My initial thoughts would be that I am not able to do so without introducing
further error into my result, but am curious if anyone else has had a similar
experience.
Thanks,
Josh
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