Dear Rietveld users,
I am currently looking for a reference for the strategy of collecting
XRD data on lab diffractometer.
With the help of new diffractometers we can collect the data in the VCT
(Variable Counting Time).
This last method has been studied by IC Madsen and RJ Hill (1994).
Now we can also collect the data with different step size for a long two
theta range (example : from 5 to 150 two theta) with some different
steps size depending of the FWHM evolution (example 0.013 / 0.026 and
0.039).
After the data can be easily modified to get the 0.013 step
(HighScorePlus).
Is there any good paper about this VCT -VSS (Variable Step Size)
methodology ?
Best wishes, Francois
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Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
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Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4AAAAJ&view_op=list_works&authuser=1&sortby=title
https://orcid.org/0000-0001-5339-3002
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