Our favored configuration is a Johansson incident beam monochromator and a 
naked PSD.


James P. Cline
Materials Measurement Science Division
National Institute of Standards and Technology
100 Bureau Dr. stop 8370 [ B113 / Bldg 217 ]
Gaithersburg, MD 20899-8523    USA
james.cl...@nist.gov<mailto:james.cl...@nist.gov>
https://www.nist.gov/people/james-p-cline
(301) 975 5793

From: rietveld_l-requ...@ill.fr <rietveld_l-requ...@ill.fr> On Behalf Of Luca 
Lutterotti
Sent: Monday, September 4, 2023 1:08 PM
To: rietveld_l@ill.fr
Cc: Habib Boughzala <habib.boughz...@ipein.rnu.tn>
Subject: Re: [EXT] [External] Re: Step-like basline

Dear Habib,

Reinhard is right, and what he explained is exactly what you observed. Now I 
would add that I may not define your Bruker clean and optimised, because for 
this kind of samples, wafers and extremely textured thin films, it would be 
better to have a monochromator in the incident beam and not a Ni filtered (I 
would more say it is a requirement). It was already showed many times in the 
past as a monochromator in the incident beam is a necessity for this materials 
to avoid all the "physical artifacts" created by the strong intensity and not 
clean Kalpha radiation.

Best regards,

Luca

[cid:image001.png@01D9DF3B.30AEB200]

Luca Lutterotti
Dipartimento di Ingegneria Industriale
Università di Trento
via Sommarive, 9 - 38123 Trento (Italy)
tel. +39 0461 2824-14 (Office), -34 (X-Ray lab)

[cid:image002.png@01D9DF3B.30AEB200][cid:image003.png@01D9DF3B.30AEB200][cid:image004.png@01D9DF3B.30AEB200][cid:image005.png@01D9DF3B.30AEB200][cid:image006.png@01D9DF3B.30AEB200]

Maud: http://maud.radiographema.com<http://maud.radiographema/>




On 4 Sep 2023, at 12:20, Habib Boughzala 
<habib.boughz...@ipein.rnu.tn<mailto:habib.boughz...@ipein.rnu.tn>> wrote:

Many thanks Reinhard,

That's exactly what I wanted to say by  "I can assure that our Bruker D8 is 
clean and optimized!"
Otherwise, in some other cases of well conditioned thin film no similar 
phenomenon is observed!
So, yes, it's obviously possible that your point of view is right.

Regards
Habib


------ Message d'origine ------
De "Reinhard Kleeberg" 
<kleeb...@mineral.tu-freiberg.de<mailto:kleeb...@mineral.tu-freiberg.de>>
À "Habib Boughzala" <boughz...@yahoo.com<mailto:boughz...@yahoo.com>>
Cc rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>
Date 04/09/2023 11:07:50
Objet Re: Re[2]: [EXT] Re: [External] Re: Step-like basline

Dear Habib,
the phenomenom "satellites or edges" originates from the diffraction process. 
The critical parameters are:
- spectral pureness of the primary beam (primary beam monochromator, tube 
spectral contamination like W...)
- the use of K beta absorbtion filter (and its thickness)
- the energy resolution ("window") of the detector system.
Even a D8 system may be equipped with different types of detectors, slits and 
energy limits can be set differently for an identical configuration, and quite 
often satellite peaks may appear later in the time of use (aging of the tube 
produces more W L, Fe filters may corrode and get perforated...). So it is 
strictly recommended to check the instrument peridically, by measuring a full 
pattern of a profile standard (LaB6 or Si or similar).
Greetings
Reinhard

Zitat von Habib Boughzala <boughz...@yahoo.com<mailto:boughz...@yahoo.com>>:

Dear all,
I would like to send you my witness related to this kind of observation.
I can assure that our Bruker D8 is clean and optimized!

In many cases of well conditioned thin film (spin coating or controlled 
diffusion) material this kind of phenomenon is visible around the highest 
reflection, especially when the preferred orientation is drastically present.

So, in my opinion, Reinhard and Alan are right, and what is observed is just 
like reflections broadening, asymmetry, shifting ...etc ... and can be related 
to the material behavior.
Now, what is the physical (crystallographic!) property responsible of this 
phenomenon? let's open the floor for a large discussion.


Habib


------ Message d'origine ------
De "Alan W Hewat" 
<alan.he...@neutronoptics.com<mailto:alan.he...@neutronoptics.com>>
À "Reinhard Kleeberg" 
<kleeb...@mineral.tu-freiberg.de<mailto:kleeb...@mineral.tu-freiberg.de>>
Cc rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>
Date 04/09/2023 09:29:08
Objet Re: [EXT] Re: [External] Re: Step-like basline

Reinhard is right that it is best to improve the instrument to produce cleaner 
data. I'm concerned about the advice to model all kinds of features whose 
origin is not fully understood, simply to obtain a better fit. Shay has told us 
nothing about his instrument or his conditions of data collection. He asks "Is 
it a sample preparation problem", to which the obvious reply is "Do you see 
this with other samples or different materials" ? Only he can answer that. If 
the answer is yes, he might try modifying his instrument (remove filters etc) 
to see what effect that has on the pattern from a simple well characterised 
material. Again only he can do that. Data collection is an experimental 
science, and data refinement should not be reduced to a "black box" computer 
program where extra parameters can be added to reduce the R-factor.
Alan.

On Mon, 4 Sept 2023 at 08:18, Reinhard Kleeberg 
<kleeb...@mineral.tu-freiberg.de<mailto:kleeb...@mineral.tu-freiberg.de>> wrote:
Can be modeled in the BGMN peak profile model as well, by modifying
the *.lam file by a series of additional Lorentzians on the 1/lambda
scale, see figure.
The same can be done for other spectral impurities, e.g. W L
satellites. Also "electronic effects" on the wavelength distribution
profile like the "edges" from the ROI settings of Si drift detectors
can be modelled in such a convolution based approach.
However, better to have a pure/simple wavelength distribution (clear
alpha1/2 doublet) by a monochromator or high energy resolution
detector, as any satellites make trouble in trace phase analysis and
do cause prolonged calculation time in complicated Rietveld refinements.

Reinhard



Zitat von Matthew Rowles <rowle...@gmail.com<mailto:rowle...@gmail.com>>:

Topas can model them quite well. The functionality was introduced in
version 5.

On Mon, 4 Sep 2023, 00:54 Kurt Leinenweber, 
<ku...@asu.edu<mailto:ku...@asu.edu>> wrote:

Hi, Are these things modeled in Rietveld programs, by chance? It seems
like a lot of baggage to put in a refinement but if it makes the results
better…



- Kurt



*From:* rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr> 
<rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr>> *On Behalf
Of *Thomas Gegan
*Sent:* Sunday, September 3, 2023 9:16 AM
*To:* Bish, David L <b...@indiana.edu<mailto:b...@indiana.edu>>; Shay Tirosh 
<stiro...@gmail.com<mailto:stiro...@gmail.com>>;
Fernando Igoa <fer.igoa.1...@gmail.com<mailto:fer.igoa.1...@gmail.com>>
*Cc:* Rietveld List (rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>) 
<rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>>
*Subject:* RE: [EXT] Re: [External] Re: Step-like basline



I agree with a Ni absorption edge, possibly with a Kβ peak around 38° 2θ.



*Tom Gegan*
Chemist III



Phone: +1 732 205-5111, Email: tom.ge...@basf.com<mailto:tom.ge...@basf.com>
Postal Address: BASF Corporation, , 25 Middlesex Essex Turnpike, 08830
Iselin, United States



*From:* rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr> 
<rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr>> *On Behalf
Of *Bish, David L
*Sent:* Sunday, September 3, 2023 7:08 AM
*To:* Shay Tirosh <stiro...@gmail.com<mailto:stiro...@gmail.com>>; Fernando 
Igoa <
fer.igoa.1...@gmail.com<mailto:fer.igoa.1...@gmail.com>>
*Cc:* Rietveld List (rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>) 
<rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>>
*Subject:* [EXT] Re: [External] Re: Step-like basline



Some people who received this message don't often get email from
b...@indiana.edu<mailto:b...@indiana.edu>. Learn why this is important
<https://urldefense.com/v3/__https:/aka.ms/LearnAboutSenderIdentification__;!!IKRxdwAv5BmarQ!fFhSHn4S5iEzkW-O9lvWG-OzoqK_2SKhRniGa71nxuOL3GcxiyD83i2mnNN0Z48HPkn4zjKqH-aqqA$>

Hello Shay,

I think it is probably related to "tube tails". You can read about this in
the literature (e.g., on the BGMN web site) and you can model it in some
Rietveld software such as Topas. You don't normally notice this but it
becomes apparent with higher-intensity peaks.



Regards,

Dave
------------------------------

*From:* rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr> 
<rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr>> on behalf
of Fernando Igoa <fer.igoa.1...@gmail.com<mailto:fer.igoa.1...@gmail.com>>
*Sent:* Sunday, September 3, 2023 3:06 AM
*To:* Shay Tirosh <stiro...@gmail.com<mailto:stiro...@gmail.com>>
*Cc:* Rietveld List (rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>) 
<rietveld_l@ill.fr<mailto:rietveld_l@ill.fr>>
*Subject:* [External] Re: Step-like basline



This message was sent from a non-IU address. Please exercise caution when
clicking links or opening attachments from external sources.



Hey Shay,



Are you using a motorized slit during the measurement? These may open up
abruptly to compensate for the angular dependence of the footprint and thus
generate an abrupt increase in the intensity.



Hope it helps :)



On Sun, Sep 3, 2023, 8:50 AM Shay Tirosh 
<stiro...@gmail.com<mailto:stiro...@gmail.com>> wrote:

Dear Rietvelders

I am attaching a zoom-in on a diffraction profile.

My question is what is the origin of the step-like profile next to a very
large reflection peak?

Is it a sample preparation problem?

Is it part of the baseline?

Thanks

Shay

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-- TU Bergakademie Freiberg
Dr. R. Kleeberg
Mineralogisches Labor
Brennhausgasse 14
D-09596 Freiberg

Tel. ++49 (0) 3731-39-3244
Fax. ++49 (0) 3731-39-3129

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