[
https://issues.apache.org/jira/browse/SANDESHA2-182?page=com.atlassian.jira.plugin.system.issuetabpanels:all-tabpanel
]
Thomas McKiernan updated SANDESHA2-182:
---------------------------------------
Attachment: unifiedEventTrace.patch
> Unify key trace collection and debug points
> -------------------------------------------
>
> Key: SANDESHA2-182
> URL: https://issues.apache.org/jira/browse/SANDESHA2-182
> Project: Sandesha2
> Issue Type: Improvement
> Reporter: Thomas McKiernan
> Attachments: unifiedEventTrace.patch
>
>
> There are times when it is difficult to debug problems in sandesha2 due to
> the amount of trace collected.
> However, it is time consuming and difficult to isolate individual
> classes/packages that are of interest.
> Also, when debugging issues in a live debugger, it is often found there are
> debug points in many locations.
> I propose a single class used for tracing key events.
> This will also be useful for live debug purposes.
--
This message is automatically generated by JIRA.
-
You can reply to this email to add a comment to the issue online.
---------------------------------------------------------------------
To unsubscribe, e-mail: [EMAIL PROTECTED]
For additional commands, e-mail: [EMAIL PROTECTED]