zorite
Dear All, Does anyone know where I can find the structural info. (space group, atomic positions, etc.) for zorite- a sodium titanium aluminum silicate hydrate? Thanks, Hongwu Dept. of Chem. Eng. & Mater. Sci. UC-Davis Davis, CA 95616
SIROQUANT Advertisement
As a (commercial) subscriber I do object to any advertisements made on '[EMAIL PROTECTED]'. I always assumed that this platform is for scientific exchange only. Maybe I am wrong but could the administrators of '[EMAIL PROTECTED]' make a clarifying statement concerning the commercial use of this user group? Ludwig Keller CAMET Research, Inc. Goleta, CA
rietveld_l@ill.fr
Does anybody know a model to simulate turbostratic effects ? P.S: I work with the program "fullprof" ,last version. Laurent CHAPON . Best regards.
RE: Refinament by BGMN
Dr. R. Kleeberg wrote: >At 13:25 29.01.99 +0100, you wrote: >>Dear all >> >>I am working with a Philips PW-1800 diffractometer and I want to do >>Rietveld's refinament by BGMN code. >> >>I need some variables of it; as goniometer radius, height and width >>of the X-ray tube?s focus, radius and width of the horizontal divergence >>slit, divergence angle of the primary collimator, radius and width of the >>vertical divergence slit, divergence angle of the secondary collimator, >>width and height of the detector slit, radius of a secondary >monochromator >> >>Can anybody help me? >> > Hi Angel Luis, >please specify the tube (type) and the additional equipment (automatic >divergence slit or none). On monday we will send a *.sav file for >calculating the geometry profiles. I would also be interested in obtaining values for an automatic divergence slit. I run Xfit and estimating the settings for a diffractometer with automatic divergence slit and graphite monochromator is not an easy task. Henry Barwood Indiana Geological Survey
Re: Refinament by BGMN
At 13:25 29.01.99 +0100, you wrote: >Dear all > >I am working with a Philips PW-1800 diffractometer and I want to do >Rietveld's refinament by BGMN code. > >I need some variables of it; as goniometer radius, height and width >of the X-ray tube´s focus, radius and width of the horizontal divergence >slit, divergence angle of the primary collimator, radius and width of the >vertical divergence slit, divergence angle of the secondary collimator, >width and height of the detector slit, radius of a secondary monochromator > >Can anybody help me? > Hi Angel Luis, please specify the tube (type) and the additional equipment (automatic divergence slit or none). On monday we will send a *.sav file for calculating the geometry profiles. Best Reinhard Kleeberg [EMAIL PROTECTED]
Re: Preferred orientation and clay minerals
At 12:04 19/01/99 +0100, Lubo wrote: >Hi Armel, >I am sure you will not be satisfied by this answer, but my solution to >this problem is : USE transmission geometry. We have been doing it for >years getting nice results for kaolinites, micas, vermiculites and >smectites, not to >speak of some organic plates. No need to add -osils (what's that, BTW). >Lubo > >P.S. I am not adding the type of diffractometer, but if you wish I can >scan a sample for you > After some scans, and up to now, the technique of mixing the sample with a solid filler material (like Cab-osil M5) or dusting a sample through a sieve are the clear (less expensive) winners of this private round robin, provided the mixture is inserted in a side-loading sample holder and never packed. Moreover a mixture fifty-fifty in volume is recommended with the amorphous solid filler technique. Transmission geometry favours of course preferred orientation directions at 90° from the reflection geometry one. With platelet habit clay minerals and 00l orientation by reflection geometry (and say, a March-Dollase parameter which can be easily as low as 0.5 when a sample is packed), one obtains with transmission geometry the reverse : a March-Dollase parameter as high as 1.5, selecting the same 00l orientation direction by the Rietveld method (no orientation corresponding to MD=1.0). The problem of course is that Rietveld refinements are of quite low quality when the MD is so different from 1 Best, Armel Le Bail - Universite du Maine, Laboratoire des Fluorures, CNRS ESA 6010, Av. O. Messiaen, 72085 Le Mans Cedex 9, France http://www.cristal.org/
Refinament by BGMN
Dear all I am working with a Philips PW-1800 diffractometer and I want to do Rietveld's refinament by BGMN code. I need some variables of it; as goniometer radius, height and width of the X-ray tube´s focus, radius and width of the horizontal divergence slit, divergence angle of the primary collimator, radius and width of the vertical divergence slit, divergence angle of the secondary collimator, width and height of the detector slit, radius of a secondary monochromator Can anybody help me? Thank a lot of. - Angel Luis Ortiz Seco e-mail: [EMAIL PROTECTED] -
Re: qz plate
> From: "Rory M Wilson (CDH) 3089" <[EMAIL PROTECTED]> > Bede Scientific, See http://bede.com/index.html for this particular company. -- Graham Patterson http://www.rdg.ac.uk:80/~slspatte Sedimentology: The hard study of soft rocks *** Opinions expressed are mine unless otherwise stated ***
Re: qz plate
About zero-background quartz or silicon plates you can contact with: "The Gem Dugout" 1652 PRINCETON DRIVE STATE COLLEGE, PA 16803 U.S.A. E-mail: [EMAIL PROTECTED] Best wishes! Vicente Dr. Vicente José Esteve-Cano | Universitat Jaume I [EMAIL PROTECTED] | Department of Inorganic & Organic Chemistry X-Ray Diffraction Lab. | Inorganic Chemistry Division P.O. Box 224 12080 CASTELLON (Spain) Tel. + 34 964 728246 & 728215 Fax + 34 964 728214 & 254585 | | | | | | | ||| |___|__||__|_|___||__
Re: qz plate
I believe that Bede Scientific, Bowburn South Industrial Estate, Bowham, Durham, DH6 5AD, UK. tel+44 (0)191 377 2476 fax 9952 make quartz and silicon 'zero' background sample holders. (At least they did the last time I enquired.) If you really want a minimum background then silicon is better than quartz. yours Rory.
qz plate
Dear All, Who can tell me where can I buy a zero-background quartz (or other material) plate? Thanks in advance for you attention § Natale Perchiazzi Dipartimento di Scienze della Terra Università degli Studi di Pisa Via S.Maria 53, I-56126 Pisa tel +39 050 847269 fax +39 050 40976 e-mail [EMAIL PROTECTED] §
SIROQUANT XRD analyses
Quantitative XRD analysis of samples can be very time consuming. I would like to introduce to you a labour-saving service based on the internet that may be of benefit to you or your company. I am a registered user of SIROQUANT software who specialises in the quantitative analysis of minerals in rock, regolith and soil materials. Please visit my web-site www.users.bigpond.com/Dr.Dave for more background information. Below are my prices for the service. PRICES $40 (Aus) to quantify X-ray diffraction data* that is supplied to me via the internet. *For mineral identification add $30 (Aus). The price for quantitative analysis of samples is based on the assumption that the minerals are present in the SIROQUANT database. For more information please e-mail me at [EMAIL PROTECTED] I look forward to being of assistance to you. Yours faithfully, Dr David B Tilley BSc(Hons) PhD Mineralogical and Geological Consultant for the Analysis of Rock, Regolith and Soil Materials.
