Hi all,
I have a disk which gives me the following smart output.
The stopped self-test is my bad.
What do you guys think? I would tend to say the drive is
OK, but 16 errors is a tad too much, imo.
Thanks,
Richard
PS: If the extended test comes up with anything bad, I
will throw it away, anyway.
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smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate NL35 family
Device Model: ST3400832NS
Serial Number:3NF1CJFP
Firmware Version: 5.01
User Capacity:400,087,375,360 bytes
Device is:In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is:Tue Apr 14 22:07:47 2009 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 247) Self-test routine in progress...
70% of test remaining.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities:(0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities:(0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability:(0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time:( 1) minutes.
Extended self-test routine
recommended polling time:( 134) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 064 049 006Pre-fail
Always - 170828508
3 Spin_Up_Time0x0003 098 097 000Pre-fail
Always - 0
4 Start_Stop_Count0x0032 100 100 020Old_age
Always - 5
5 Reallocated_Sector_Ct 0x0033 100 100 036Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 074 060 030Pre-fail
Always - 29283841
9 Power_On_Hours 0x0032 100 100 000Old_age
Always - 440
10 Spin_Retry_Count0x0013 100 100 097Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 100 100 020Old_age
Always - 19
194 Temperature_Celsius 0x0022 046 049 000Old_age
Always - 46 (Lifetime Min/Max 0/21)
195 Hardware_ECC_Recovered 0x001a 064 048 000Old_age
Always - 170828508
197 Current_Pending_Sector 0x0012 100 100 000Old_age
Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000Old_age
Offline - 0
199 UDMA_CRC_Error_Count0x003e 200 200 000Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x 100 253 000Old_age
Offline - 0
202 TA_Increase_Count 0x0032 100 253 000Old_age
Always - 0
SMART Error Log Version: 1
ATA Error Count: 16 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It wraps after 49.710 days.
Error 16 occurred at disk power-on lifetime: 20 hours (0 days + 20 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion