Re: [edk2-devel] [PATCH EDK2 v3 1/1] MdeModulePkg/UefiSortLib:Add UefiSortLib unit test
> -Original Message-
> From: devel@edk2.groups.io On Behalf Of Wu, Hao
> A
> Sent: Wednesday, August 11, 2021 4:33 PM
> To: Liming Gao ; Wenyi Xie
> ; devel@edk2.groups.io
> Cc: songdongku...@huawei.com; Wang, Jian J
> Subject: Re: [edk2-devel] [PATCH EDK2 v3 1/1]
> MdeModulePkg/UefiSortLib:Add UefiSortLib unit test
>
> > -Original Message-
> > From: Wenyi Xie
> > Sent: Wednesday, August 11, 2021 2:36 PM
> > To: devel@edk2.groups.io; Wang, Jian J ; Wu, Hao
> A
> >
> > Cc: songdongku...@huawei.com; xiewen...@huawei.com
> > Subject: [PATCH EDK2 v3 1/1] MdeModulePkg/UefiSortLib:Add UefiSortLib
> > unit test
> >
> > Adding two unit test case for UefiSortLib. One is a test on sorting an array
> of
> > UINT32 by using PerformQuickSort, another is a test on comparing the
> same
> > buffer by using StringCompare.
> > Add 'main' function name to ECC exception list to avoid ECC error.
>
>
> Reviewed-by: Hao A Wu
>
> Hello Liming,
>
> Since the patch looks more like a feature than a bugfix to me, I would like to
> confirm that can I merge this change now?
> I already gave my 'R-b' tag for the V2 patch on 29th July, but met some ECC
> check issues during previous merging attempt.
> I verified that the latest patch can pass the merging test
> (https://github.com/tianocore/edk2/pull/1892).
Since no objection received, pushed via:
PR - https://github.com/tianocore/edk2/pull/1892
Commit -
https://github.com/tianocore/edk2/commit/ac826886c98524e918753419c039d8b44198943f
If this commit breaks the Soft Feature Freeze rule, please help to raise. I
will revert it.
Best Regards,
Hao Wu
>
> Best Regards,
> Hao Wu
>
>
> >
> > Cc: Jian J Wang
> > Cc: Hao A Wu
> > Signed-off-by: Wenyi Xie
> > ---
> > MdeModulePkg/Test/MdeModulePkgHostTest.dsc| 6 +
> > MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf | 32
> > +++
> > MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c | 207
> >
> > MdeModulePkg/MdeModulePkg.ci.yaml | 1 +
> > 4 files changed, 246 insertions(+)
> >
> > diff --git a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> > b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> > index 4da4692c8451..c9ec835df65d 100644
> > --- a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> > +++ b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> > @@ -41,3 +41,9 @@ [Components]
> >
> >
> >
> gEfiMdeModulePkgTokenSpaceGuid.PcdAllowVariablePolicyEnforcementDis
> > able|TRUE
> >}
> > +
> > + MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf {
> > +
> > + UefiSortLib|MdeModulePkg/Library/UefiSortLib/UefiSortLib.inf
> > +
> > + DevicePathLib|MdePkg/Library/UefiDevicePathLib/UefiDevicePathLib.inf
> > + }
> > diff --git
> > a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> > b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> > new file mode 100644
> > index ..85d8dcd69619
> > --- /dev/null
> > +++
> b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> > @@ -0,0 +1,32 @@
> > +## @file
> > +# This is a unit test for the UefiSortLib.
> > +#
> > +# Copyright (C) Huawei Technologies Co., Ltd. All rights reserved #
> > +SPDX-License-Identifier: BSD-2-Clause-Patent ##
> > +
> > +[Defines]
> > + INF_VERSION = 0x00010017
> > + BASE_NAME = UefiSortLibUnitTest
> > + FILE_GUID = 271337A3-0D79-BA3E-BC03-714E518E3B1B
> > + VERSION_STRING = 1.0
> > + MODULE_TYPE = HOST_APPLICATION
> > +
> > +#
> > +# The following information is for reference only and not required by the
> > build tools.
> > +#
> > +# VALID_ARCHITECTURES = IA32 X64
> > +#
> > +
> > +[Sources]
> > + UefiSortLibUnitTest.c
> > +
> > +[Packages]
> > + MdePkg/MdePkg.dec
> > + MdeModulePkg/MdeModulePkg.dec
> > + UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
> > +
> > +[LibraryClasses]
> > + UnitTestLib
> > + DebugLib
> > + UefiSortLib
> > diff --git
> > a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
> > b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
> > new file mode 100644
> > index ..4f44a02c5b5d
> > --- /dev/null
> > +++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
&g
Re: [edk2-devel] [PATCH EDK2 v3 1/1] MdeModulePkg/UefiSortLib:Add UefiSortLib unit test
> -Original Message-
> From: Wenyi Xie
> Sent: Wednesday, August 11, 2021 2:36 PM
> To: devel@edk2.groups.io; Wang, Jian J ; Wu, Hao A
>
> Cc: songdongku...@huawei.com; xiewen...@huawei.com
> Subject: [PATCH EDK2 v3 1/1] MdeModulePkg/UefiSortLib:Add UefiSortLib
> unit test
>
> Adding two unit test case for UefiSortLib. One is a test on sorting an array
> of
> UINT32 by using PerformQuickSort, another is a test on comparing the same
> buffer by using StringCompare.
> Add 'main' function name to ECC exception list to avoid ECC error.
Reviewed-by: Hao A Wu
Hello Liming,
Since the patch looks more like a feature than a bugfix to me, I would like to
confirm that can I merge this change now?
I already gave my 'R-b' tag for the V2 patch on 29th July, but met some ECC
check issues during previous merging attempt.
I verified that the latest patch can pass the merging test
(https://github.com/tianocore/edk2/pull/1892).
Best Regards,
Hao Wu
>
> Cc: Jian J Wang
> Cc: Hao A Wu
> Signed-off-by: Wenyi Xie
> ---
> MdeModulePkg/Test/MdeModulePkgHostTest.dsc| 6 +
> MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf | 32
> +++
> MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c | 207
>
> MdeModulePkg/MdeModulePkg.ci.yaml | 1 +
> 4 files changed, 246 insertions(+)
>
> diff --git a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> index 4da4692c8451..c9ec835df65d 100644
> --- a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> +++ b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
> @@ -41,3 +41,9 @@ [Components]
>
>
> gEfiMdeModulePkgTokenSpaceGuid.PcdAllowVariablePolicyEnforcementDis
> able|TRUE
>}
> +
> + MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf {
> +
> + UefiSortLib|MdeModulePkg/Library/UefiSortLib/UefiSortLib.inf
> +
> + DevicePathLib|MdePkg/Library/UefiDevicePathLib/UefiDevicePathLib.inf
> + }
> diff --git
> a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> new file mode 100644
> index ..85d8dcd69619
> --- /dev/null
> +++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
> @@ -0,0 +1,32 @@
> +## @file
> +# This is a unit test for the UefiSortLib.
> +#
> +# Copyright (C) Huawei Technologies Co., Ltd. All rights reserved #
> +SPDX-License-Identifier: BSD-2-Clause-Patent ##
> +
> +[Defines]
> + INF_VERSION = 0x00010017
> + BASE_NAME = UefiSortLibUnitTest
> + FILE_GUID = 271337A3-0D79-BA3E-BC03-714E518E3B1B
> + VERSION_STRING = 1.0
> + MODULE_TYPE = HOST_APPLICATION
> +
> +#
> +# The following information is for reference only and not required by the
> build tools.
> +#
> +# VALID_ARCHITECTURES = IA32 X64
> +#
> +
> +[Sources]
> + UefiSortLibUnitTest.c
> +
> +[Packages]
> + MdePkg/MdePkg.dec
> + MdeModulePkg/MdeModulePkg.dec
> + UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
> +
> +[LibraryClasses]
> + UnitTestLib
> + DebugLib
> + UefiSortLib
> diff --git
> a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
> b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
> new file mode 100644
> index ..4f44a02c5b5d
> --- /dev/null
> +++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
> @@ -0,0 +1,207 @@
> +/** @file
> + Unit tests of the UefiSortLib
> +
> + Copyright (C) Huawei Technologies Co., Ltd. All rights reserved
> + SPDX-License-Identifier: BSD-2-Clause-Patent
> +
> +**/
> +
> +#include
> +#include
> +#include
> +#include
> +#include
> +#include
> +
> +#include
> +#include
> +#include
> +#include
> +
> +#include
> +#include
> +
> +#define UNIT_TEST_APP_NAME"UefiSortLib Unit Tests"
> +#define UNIT_TEST_APP_VERSION "1.0"
> +
> +#define TEST_ARRAY_SIZE_9 9
> +
> +/**
> + The function is called by PerformQuickSort to compare int values.
> +
> + @param[in] LeftThe pointer to first buffer.
> + @param[in] Right The pointer to second buffer.
> +
> + @retval 0 Buffer1 equal to Buffer2.
> + @return <0 Buffer1 is less than Buffer2.
> + @return >0 Buffer1 is greater than Buffer2.
> +
> +**/
> +INTN
> +EFIAPI
> +TestCompareFunction (
> + IN CONST VOID *Left,
> + IN CONST VOID *Right
> + )
> +{
> + if (*(UINT32*)Right > *(UINT32*)Left) {
> +return 1;
> + } else if (*(UINT32*)Right < *(UINT32*)Left) {
> +return -1;
> + }
> +
> + return 0;
> +}
> +
> +/**
> + Unit test for PerformQuickSort () API of the UefiSortLib.
> +
> + @param[in] Context[Optional] An optional parameter that enables:
> + 1) test-case reuse with varied parameters and
> + 2) test-case re-ent
[edk2-devel] [PATCH EDK2 v3 1/1] MdeModulePkg/UefiSortLib:Add UefiSortLib unit test
Adding two unit test case for UefiSortLib. One is a test on
sorting an array of UINT32 by using PerformQuickSort, another
is a test on comparing the same buffer by using StringCompare.
Add 'main' function name to ECC exception list to avoid ECC
error.
Cc: Jian J Wang
Cc: Hao A Wu
Signed-off-by: Wenyi Xie
---
MdeModulePkg/Test/MdeModulePkgHostTest.dsc| 6 +
MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf | 32 +++
MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c | 207
MdeModulePkg/MdeModulePkg.ci.yaml | 1 +
4 files changed, 246 insertions(+)
diff --git a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
index 4da4692c8451..c9ec835df65d 100644
--- a/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
+++ b/MdeModulePkg/Test/MdeModulePkgHostTest.dsc
@@ -41,3 +41,9 @@ [Components]
gEfiMdeModulePkgTokenSpaceGuid.PcdAllowVariablePolicyEnforcementDisable|TRUE
}
+
+ MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf {
+
+ UefiSortLib|MdeModulePkg/Library/UefiSortLib/UefiSortLib.inf
+ DevicePathLib|MdePkg/Library/UefiDevicePathLib/UefiDevicePathLib.inf
+ }
diff --git a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
new file mode 100644
index ..85d8dcd69619
--- /dev/null
+++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.inf
@@ -0,0 +1,32 @@
+## @file
+# This is a unit test for the UefiSortLib.
+#
+# Copyright (C) Huawei Technologies Co., Ltd. All rights reserved
+# SPDX-License-Identifier: BSD-2-Clause-Patent
+##
+
+[Defines]
+ INF_VERSION = 0x00010017
+ BASE_NAME = UefiSortLibUnitTest
+ FILE_GUID = 271337A3-0D79-BA3E-BC03-714E518E3B1B
+ VERSION_STRING = 1.0
+ MODULE_TYPE = HOST_APPLICATION
+
+#
+# The following information is for reference only and not required by the
build tools.
+#
+# VALID_ARCHITECTURES = IA32 X64
+#
+
+[Sources]
+ UefiSortLibUnitTest.c
+
+[Packages]
+ MdePkg/MdePkg.dec
+ MdeModulePkg/MdeModulePkg.dec
+ UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
+
+[LibraryClasses]
+ UnitTestLib
+ DebugLib
+ UefiSortLib
diff --git a/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
new file mode 100644
index ..4f44a02c5b5d
--- /dev/null
+++ b/MdeModulePkg/Library/UefiSortLib/UnitTest/UefiSortLibUnitTest.c
@@ -0,0 +1,207 @@
+/** @file
+ Unit tests of the UefiSortLib
+
+ Copyright (C) Huawei Technologies Co., Ltd. All rights reserved
+ SPDX-License-Identifier: BSD-2-Clause-Patent
+
+**/
+
+#include
+#include
+#include
+#include
+#include
+#include
+
+#include
+#include
+#include
+#include
+
+#include
+#include
+
+#define UNIT_TEST_APP_NAME"UefiSortLib Unit Tests"
+#define UNIT_TEST_APP_VERSION "1.0"
+
+#define TEST_ARRAY_SIZE_9 9
+
+/**
+ The function is called by PerformQuickSort to compare int values.
+
+ @param[in] LeftThe pointer to first buffer.
+ @param[in] Right The pointer to second buffer.
+
+ @retval 0 Buffer1 equal to Buffer2.
+ @return <0 Buffer1 is less than Buffer2.
+ @return >0 Buffer1 is greater than Buffer2.
+
+**/
+INTN
+EFIAPI
+TestCompareFunction (
+ IN CONST VOID *Left,
+ IN CONST VOID *Right
+ )
+{
+ if (*(UINT32*)Right > *(UINT32*)Left) {
+return 1;
+ } else if (*(UINT32*)Right < *(UINT32*)Left) {
+return -1;
+ }
+
+ return 0;
+}
+
+/**
+ Unit test for PerformQuickSort () API of the UefiSortLib.
+
+ @param[in] Context[Optional] An optional parameter that enables:
+ 1) test-case reuse with varied parameters and
+ 2) test-case re-entry for Target tests that need a
+ reboot. This parameter is a VOID* and it is the
+ responsibility of the test author to ensure that the
+ contents are well understood by all test cases that
may
+ consume it.
+
+ @retval UNIT_TEST_PASSED The Unit test has completed and the
test
+case was successful.
+ @retval UNIT_TEST_ERROR_TEST_FAILED A test case assertion has failed.
+**/
+UNIT_TEST_STATUS
+EFIAPI
+SortUINT32ArrayShouldSucceed (
+ IN UNIT_TEST_CONTEXT Context
+ )
+{
+ UINTN TestCount;
+ UINT32 Index;
+ UINT32 TestBuffer[TEST_ARRAY_SIZE_9];
+ UINT32 TestResult[TEST_ARRAY_SIZE_9];
+
+ TestCount = TEST_ARRAY_SIZE_9;
+ for (Index = 0; Index < TEST_ARRAY_SIZE_9; Index++) {
+TestBuffer[Index] = Index + 1;
+TestResult[Index] = TEST_ARRAY_SIZE_9 - Index;
+ }
+
+ PerformQuickSort (TestBuffer, TestCo
