Re: Shrunk-die power MOSFET's and compliance

2001-10-26 Thread Michael Heckrotte

I worked with power MOSFETs in the past and found that the reverse
recovery characteristics (soft versus abrupt) correlated with emissions,
but we could not derive a quantitative acceptance criteria.  Vendors
could easily specify and sort by reverse recovery time, but that was a
different parameter, and was inadequately related to emisions levels. 

Technically the best solution was to test and approve FETs by batch
number, based on the measured emissions of a sample product.

  

"Cook, Jack" wrote:
> 
> The practice of die shrinking & speedups causes problems in the digital IC
> arena also.  The old but once heavily used 8051 processor is an example.
> Original designs were with the NMOS (HMOS?) version but later began being
> replaced by faster CMOS versions.  We could see some of that clearly in
> certain product audits.
> 
> Jack Cook,
> Xerox EMC Engineering
> 
> -Original Message-
> From: Dan Kwok [mailto:dk...@intetron.com]
> Sent: Thursday, October 25, 2001 1:16 PM
> To: Jim Eichner; 'EMC-PSTC - forum'
> Subject: Re: Shrunk-die power MOSFET's and compliance
> 
> Jim,
> 
> You have my sympathies. Some manufacturers don't seem to realize that their
> so called product "improvements" may actually cause undue grief and
> hardships
> on their customers. "Specifications subject to change without notice" is a
> common catch clause associated with far many products on the market these
> days.
> 
> In one company where I worked many years ago, we had an incoming inspection
> department that routinely carried out random samplings and measured critical
> parameters for crystals and semiconductors. With this approach, most
> out-of-spec devices simply did not make it to the store bins.
> 
> On the brighter side, speeding up a FET is hard to do. Slowing it down in a
> circuit is much easier for EMC purposes.
> 
> -
> Dan Kwok,  P.Eng.
> Principal Engineer
> Electromagnetic Compatibility
> Intetron Consulting,  Inc.
> Ph  (604) 432-9874
> E-mail dk...@intetron.com
> Internet  http://www.intetron.com
> 
> ----- Original Message -
> From: "Jim Eichner" 
> To: ; "Jim Eichner" ;
> "'EMC-PSTC - forum'" 
> Sent: Wednesday, October 24, 2001 11:54 AM
> Subject: RE: Shrunk-die power MOSFET's and compliance
> 
> >
> > Well for example, I have just finished specifying what compliance
> re-testing
> > I am going to need to do on 4 different products whose power conversion
> > stages use IRF630's, IRF740's, IRF840's, and RFP50N06's, but the list goes
> > on and on.  If you are using power FET's in power electronics, chances are
> > they have changed or will soon.  The main manufacturers that come to mind
> > are IR, Fairchild/Harris, Philips, and STM-Thomson.  Not all have forced
> > changes to the shrunk-die version - some have agreed to keep the old style
> > available - and all have at least added a suffix to their markings on the
> > devices so you can tell if it's the new revision die or old.  In one case,
> > however, we received modified parts with no markings differentiating them
> > from the old rev parts, for almost a year with no communication from the
> mfr
> > telling us about the change.  We found out through other channels and then
> > contacted them.  They seem to be behaving as if fundamental changes to the
> > performance and specifications of the part are none of our business.
> >
> > I am re-doing radiated and conducted emissions, some thermal testing, and
> a
> > bunch of functional testing and looking at waveforms on 4 different
> products
> > affected by this change.  Those are only the products I am responsible
> for -
> > as a company we're doing functional testing and possibly compliance
> > re-testing on many more products.
> >
> > This is not a simple component substitution exercise, if your products are
> > or use power electronics!  I would advise everyone potentially affected to
> > have your procurement department look into this.
> >
> > Regards,
> > Jim Eichner, P.Eng.
> > Manager, Engineering Services
> > Xantrex Technology Inc.
> > Mobile Power
> > web: www.xantrex.com <http://www.xantrex.com>
> > Any opinions expressed are those of my invisible friend, who really
> > exists. Honest.
> >
> >
> >
> 
> ---
> This message is from the IEEE EMC Society Product Safety
> Technical Committee emc-pstc discussion list.
> 
> Visit our web site

RE: Shrunk-die power MOSFET's and compliance

2001-10-25 Thread Cook, Jack


The practice of die shrinking & speedups causes problems in the digital IC
arena also.  The old but once heavily used 8051 processor is an example.
Original designs were with the NMOS (HMOS?) version but later began being
replaced by faster CMOS versions.  We could see some of that clearly in
certain product audits.

Jack Cook,
Xerox EMC Engineering

-Original Message-
From: Dan Kwok [mailto:dk...@intetron.com]
Sent: Thursday, October 25, 2001 1:16 PM
To: Jim Eichner; 'EMC-PSTC - forum'
Subject: Re: Shrunk-die power MOSFET's and compliance



Jim,

You have my sympathies. Some manufacturers don't seem to realize that their
so called product "improvements" may actually cause undue grief and
hardships
on their customers. "Specifications subject to change without notice" is a
common catch clause associated with far many products on the market these
days.

In one company where I worked many years ago, we had an incoming inspection
department that routinely carried out random samplings and measured critical
parameters for crystals and semiconductors. With this approach, most
out-of-spec devices simply did not make it to the store bins.

On the brighter side, speeding up a FET is hard to do. Slowing it down in a
circuit is much easier for EMC purposes.

-
Dan Kwok,  P.Eng.
Principal Engineer
Electromagnetic Compatibility
Intetron Consulting,  Inc.
Ph  (604) 432-9874
E-mail dk...@intetron.com
Internet  http://www.intetron.com




- Original Message -
From: "Jim Eichner" 
To: ; "Jim Eichner" ;
"'EMC-PSTC - forum'" 
Sent: Wednesday, October 24, 2001 11:54 AM
Subject: RE: Shrunk-die power MOSFET's and compliance


>
> Well for example, I have just finished specifying what compliance
re-testing
> I am going to need to do on 4 different products whose power conversion
> stages use IRF630's, IRF740's, IRF840's, and RFP50N06's, but the list goes
> on and on.  If you are using power FET's in power electronics, chances are
> they have changed or will soon.  The main manufacturers that come to mind
> are IR, Fairchild/Harris, Philips, and STM-Thomson.  Not all have forced
> changes to the shrunk-die version - some have agreed to keep the old style
> available - and all have at least added a suffix to their markings on the
> devices so you can tell if it's the new revision die or old.  In one case,
> however, we received modified parts with no markings differentiating them
> from the old rev parts, for almost a year with no communication from the
mfr
> telling us about the change.  We found out through other channels and then
> contacted them.  They seem to be behaving as if fundamental changes to the
> performance and specifications of the part are none of our business.
>
> I am re-doing radiated and conducted emissions, some thermal testing, and
a
> bunch of functional testing and looking at waveforms on 4 different
products
> affected by this change.  Those are only the products I am responsible
for -
> as a company we're doing functional testing and possibly compliance
> re-testing on many more products.
>
> This is not a simple component substitution exercise, if your products are
> or use power electronics!  I would advise everyone potentially affected to
> have your procurement department look into this.
>
> Regards,
> Jim Eichner, P.Eng.
> Manager, Engineering Services
> Xantrex Technology Inc.
> Mobile Power
> web: www.xantrex.com <http://www.xantrex.com>
> Any opinions expressed are those of my invisible friend, who really
> exists. Honest.
>
>
>



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Re: Shrunk-die power MOSFET's and compliance

2001-10-25 Thread Dan Kwok

Jim,

You have my sympathies. Some manufacturers don't seem to realize that their
so called product "improvements" may actually cause undue grief and hardships
on their customers. "Specifications subject to change without notice" is a
common catch clause associated with far many products on the market these
days.

In one company where I worked many years ago, we had an incoming inspection
department that routinely carried out random samplings and measured critical
parameters for crystals and semiconductors. With this approach, most
out-of-spec devices simply did not make it to the store bins.

On the brighter side, speeding up a FET is hard to do. Slowing it down in a
circuit is much easier for EMC purposes.

-
Dan Kwok,  P.Eng.
Principal Engineer
Electromagnetic Compatibility
Intetron Consulting,  Inc.
Ph  (604) 432-9874
E-mail dk...@intetron.com
Internet  http://www.intetron.com




- Original Message -
From: "Jim Eichner" 
To: ; "Jim Eichner" ;
"'EMC-PSTC - forum'" 
Sent: Wednesday, October 24, 2001 11:54 AM
Subject: RE: Shrunk-die power MOSFET's and compliance


>
> Well for example, I have just finished specifying what compliance
re-testing
> I am going to need to do on 4 different products whose power conversion
> stages use IRF630's, IRF740's, IRF840's, and RFP50N06's, but the list goes
> on and on.  If you are using power FET's in power electronics, chances are
> they have changed or will soon.  The main manufacturers that come to mind
> are IR, Fairchild/Harris, Philips, and STM-Thomson.  Not all have forced
> changes to the shrunk-die version - some have agreed to keep the old style
> available - and all have at least added a suffix to their markings on the
> devices so you can tell if it's the new revision die or old.  In one case,
> however, we received modified parts with no markings differentiating them
> from the old rev parts, for almost a year with no communication from the
mfr
> telling us about the change.  We found out through other channels and then
> contacted them.  They seem to be behaving as if fundamental changes to the
> performance and specifications of the part are none of our business.
>
> I am re-doing radiated and conducted emissions, some thermal testing, and a
> bunch of functional testing and looking at waveforms on 4 different
products
> affected by this change.  Those are only the products I am responsible
for -
> as a company we're doing functional testing and possibly compliance
> re-testing on many more products.
>
> This is not a simple component substitution exercise, if your products are
> or use power electronics!  I would advise everyone potentially affected to
> have your procurement department look into this.
>
> Regards,
> Jim Eichner, P.Eng.
> Manager, Engineering Services
> Xantrex Technology Inc.
> Mobile Power
> web: www.xantrex.com <http://www.xantrex.com>
> Any opinions expressed are those of my invisible friend, who really
> exists. Honest.
>
>
>



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RE: Shrunk-die power MOSFET's and compliance

2001-10-24 Thread Jim Eichner

Well for example, I have just finished specifying what compliance re-testing
I am going to need to do on 4 different products whose power conversion
stages use IRF630's, IRF740's, IRF840's, and RFP50N06's, but the list goes
on and on.  If you are using power FET's in power electronics, chances are
they have changed or will soon.  The main manufacturers that come to mind
are IR, Fairchild/Harris, Philips, and STM-Thomson.  Not all have forced
changes to the shrunk-die version - some have agreed to keep the old style
available - and all have at least added a suffix to their markings on the
devices so you can tell if it's the new revision die or old.  In one case,
however, we received modified parts with no markings differentiating them
from the old rev parts, for almost a year with no communication from the mfr
telling us about the change.  We found out through other channels and then
contacted them.  They seem to be behaving as if fundamental changes to the
performance and specifications of the part are none of our business.

I am re-doing radiated and conducted emissions, some thermal testing, and a
bunch of functional testing and looking at waveforms on 4 different products
affected by this change.  Those are only the products I am responsible for -
as a company we're doing functional testing and possibly compliance
re-testing on many more products.

This is not a simple component substitution exercise, if your products are
or use power electronics!  I would advise everyone potentially affected to
have your procurement department look into this.

Regards, 
Jim Eichner, P.Eng. 
Manager, Engineering Services 
Xantrex Technology Inc. 
Mobile Power
web: www.xantrex.com <http://www.xantrex.com> 
Any opinions expressed are those of my invisible friend, who really
exists. Honest.



-Original Message-
From: Michael Mertinooke [mailto:mertino...@skyskan.com]
Sent: Wednesday, October 24, 2001 6:45 AM
To: 'Jim Eichner'
Subject: RE: Shrunk-die power MOSFET's and compliance


Jim;

I suspect that a lot of us just don't have time to investigate the latest
subtleties involved in producing a new chip design sold under an
old component part number. We order by manufacturer part number
and when the order comes in we count the pieces and throw it in
the stockroom. 

If there are reliability problems, most companies take a month or
so for the news to get back from Field Service. Then the issue goes
to Manufacturing because we know the design worked perfectly for
X years, so Manufacturing must have built 'em wrong, or the PC
house had a bad batch of boards or somebody screwed up the
wave solder machine again or the stockroom was sweeping parts
off the floor and dumping them back in the bins ... or a hundred
other cockups that happen every day. By the time somebody 
finally figures out that the FETs are not performing as they should,
it could be a year after the parts first hit the receiving dock.

Instead of a general reference, perhaps you can provide a few 
part numbers? If I see such a list and my FETs are on it, then 
I sure as hell am going to look into it immediately! 

Thanks.
Mike Mertinooke

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RE: Shrunk-die power MOSFET's and compliance

2001-10-24 Thread Jim Eichner

No takers?  I haven't had any responses, but I can't believe that ins't an
issue for many of you.  The switch-mode power supplies used in almost all
equipment these days are the main users of these FET's, and the FET design
change does effect compliance.

Have none of you run into this issue? 


Jim Eichner, P.Eng.
Manager, Engineering Services
Xantrex Technology Inc.
Mobile Power
phone:  (604) 422-2546
fax:  (604) 420-1591
e-mail:  jim.eich...@xantrex.com
web: www.xantrex.com 


-Original Message-
From: Jim Eichner [mailto:jim.eich...@xantrex.com]
Sent: Wednesday, October 17, 2001 5:11 PM
To: 'EMC-PSTC - forum'
Subject: Shrunk-die power MOSFET's and compliance



I'm curious what others in the compliance community have experienced over
the last year or so in regards to re-designed power MOSFET's that the big
FET manufacturers are pushing on us.  These next generation "trench" style
FET's have smaller dies, resulting in lower on-resistance but higher thermal
impedance to their cases, and in lower gate capacitances and faster rise
times.  

At first glance it seems obvious these changes could impact the compliance
of power conversion products in the areas of emissions (increase due to
faster rise times), susceptibility to surges, and perhaps temperatures (not
that agencies care about FET temperatures, but if they're hotter
neighbouring components may be too).

The FET's involved are some of the highest volume parts these mfr's make (to
achieve maximum savings), and are widely used in power electronics.  Since
most products either are, use, or contain power electronics these days, I'd
expect this issue to be affecting almost all of us.

I'd be glad to hear of any experiences the forum has had with this issue.

Thanks,
Jim Eichner, P.Eng. 
Manager, Engineering Services 
Xantrex Technology Inc. 
Mobile Power
web: www.xantrex.com
Any opinions expressed are those of my invisible friend, who really exists.
Honest.


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