Re: [Ifeffit] Transmission EXAFS sample

2010-11-23 Thread Jatinkumar Rana

On 22.11.2010 19:00, ifeffit-requ...@millenia.cars.aps.anl.gov wrote:

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Today's Topics:

1. Re: Transmission EXAFS sample (Scott Calvin)
2. Re: Transmission EXAFS sample (Scott Calvin)
3. maximum number of paths in Artemis (Yuan Ping)


--

Message: 1
Date: Mon, 22 Nov 2010 07:13:42 -0800
From: Scott Calvin
To: XAFS Analysis using Ifeffit
Subject: Re: [Ifeffit] Transmission EXAFS sample
Message-ID:<5b5040d9-f501-4ba0-8f24-38630b43b...@gmail.edu>
Content-Type: text/plain; charset=US-ASCII; format=flowed; delsp=yes

To my mind, when considering sample preparation the important thing is
not so much the "right" thickness, as knowing the effects to guard
against as the thickness deviates toward the thin or thick side.

As transmission samples become thicker, the problem of "unwanted"
photons becomes more severe. Those photons may be harmonics, photons
scattered into the It detector, or photons from the tails of the
resolution curve of the monochromator.

As transmission samples become thinner, uniformity becomes more of an
issue. If you play with the equations, you'll see that if your sample
is a mixture of regions that have a thickness of 1.0 absorption
lengths and regions that have a thickness of 2.0 absorption lengths,
the spectrum is less distorted than if it is a mixture of 0.5 and 1.0
absorption lengths.

So if a sample is on the thick side, it is particularly important to
guard against harmonics in the beam and scattered photons. If it is on
the thin side, it is particularly important to guard against
nonuniformity.

To put it another way, problems are synergistic. With a well-
conditioned beam, a uniform sample, and linear detectors, the
thickness almost doesn't matter (within reason)--at a modern beamline,
a total absorption of even 0.05 or 4.0 will work.

But as each of those conditions deviates from the ideal, distortions
become much more severe.

There's an old joke about someone on a diet going in to a fast food
joint and asking for a double bacon cheeseburger, a large fries...and
a diet Coke. In XAFS measurements, that attitude actually kind of
works, because of the synergies I just discussed.

Personally, I trust my ability to condition the beam and minimize
scattering more than I trust my ability to make a uniform sample, so I
lean a little toward the thicker side.

--Scott Calvin
Faculty at Sarah Lawrence College
Currently on sabbatical at Stanford Synchrotron Radiation Laboratory



On Nov 22, 2010, at 5:13 AM, Welter, Edmund wrote:

   

Dear Jatin,

the optimum mued of 2.x is not just derived by simple photon counting
statistics. As Matt pointed out, for transmission measurements at a
synchrotron beamline in conventional scanning mode this is seldom a
matter. Nevertheless, one should avoid to measure subtle changes of
absorption at the extreme ends, that is, transmission near 0 % or
100 %.
In optical photometry this is described by the more or less famous
"Ringbom plots" which describe the dependency of the accuracy of
quantitative analysis by absorption measurements (usually but not
necessarily in the UV/Vis) from the total absorption of the sample.

This time the number is only near to 42, the optimum transmission is
36.8 % (mue = 1). So, to achieve the highest accuracy in the
determination of small Delta c (c = concentration) you should try to
measure samples with transmissions near to this value (actually the
minimum is broad and transmissions between 0.2 and 0.7 are ok). In our
case, we are not interested in the concentration of the absorber,
but we
are also interested in (very) small changes of the transmission resp.
absorption in our samples. Or, using Bouger, Lambert Beer's law, in
our
case mue (-ln(I1/I0) is a function of the absorption coefficient
(mue0).
The concentration of the absorber and the thickness (d) of the sample
are constant.

-ln(I1/I0) = mue0 * c * d

But then: If the optimum is a mue between 0.35 and 1.6 why are we all
measuring successfully (ok, more or less ;-) using samples having a
mue
between 2 and 3? ...and 0.35 seems desperately small to me! Maybe
sample
homogeneity is an issue?

Cheers,
Edmund Welter


 



--

Message: 2
Date: Mon, 22 Nov 2010 07:16:06 -0800
From: Scott Calvin
To: XAFS Analysis using Ifeffit
Subject: Re: [Ifeffit] Transmission EXAF

Re: [Ifeffit] Transmission EXAFS sample

2010-11-22 Thread Matt Newville
Hi Edmund,

Thanks for that post...   I'd never seen the UV-vis literature on this
and didn't know what a Ringbom plot was. A  google search led to
Ramirez-Munoz 1967 (doi:10.1016/0026-265X(67)90042-2) on
Atomic-Absorption Photometry, which shows a very nice result that
significant distortions don't really appear until outside 20 to 80%
total absorption.

The focus seems to be  on total absorption, which makes sense as the
most important term.  But for XAFS, it's not that unusual to have
fairly large total absorption due to window and sample cell materials
(say, diamonds in a diamond anvil cell), but still have decent data
that has an edge step between 0.2 and 1.5.Perhaps that means that
counting statistics really never matter for transmission XAFS, and the
reason to not go above an edge step of 3 or 4 is spatial inhomogeneity
in the sample and beam, and harmonics.

--Matt

On Mon, Nov 22, 2010 at 7:13 AM, Welter, Edmund  wrote:
> Dear Jatin,
>
> the optimum mued of 2.x is not just derived by simple photon counting
> statistics. As Matt pointed out, for transmission measurements at a
> synchrotron beamline in conventional scanning mode this is seldom a matter.
> Nevertheless, one should avoid to measure subtle changes of absorption at
> the extreme ends, that is, transmission near 0 % or 100 %. In optical
> photometry this is described by the more or less famous "Ringbom plots"
> which describe the dependency of the accuracy of quantitative analysis by
> absorption measurements (usually but not necessarily in the UV/Vis) from the
> total absorption of the sample.
>
> This time the number is only near to 42, the optimum transmission is 36.8 %
> (mue = 1). So, to achieve the highest accuracy in the determination of small
> Delta c (c = concentration) you should try to measure samples with
> transmissions near to this value (actually the minimum is broad and
> transmissions between 0.2 and 0.7 are ok). In our case, we are not
> interested in the concentration of the absorber, but we are also interested
> in (very) small changes of the transmission resp. absorption in our samples.
> Or, using Bouger, Lambert Beer's law, in our case mue (-ln(I1/I0) is a
> function of the absorption coefficient (mue0). The concentration of the
> absorber and the thickness (d) of the sample are constant.
>
> -ln(I1/I0) = mue0 * c * d
>
> But then: If the optimum is a mue between 0.35 and 1.6 why are we all
> measuring successfully (ok, more or less ;-) using samples having a mue
> between 2 and 3? ...and 0.35 seems desperately small to me! Maybe sample
> homogeneity is an issue?
>
> Cheers,
> Edmund Welter
>
>
>
>
>
>
> ___
> Ifeffit mailing list
> Ifeffit@millenia.cars.aps.anl.gov
> http://millenia.cars.aps.anl.gov/mailman/listinfo/ifeffit
>
>
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Re: [Ifeffit] Transmission EXAFS sample

2010-11-22 Thread Scott Calvin


On Nov 22, 2010, at 7:09 AM, Jatinkumar Rana wrote:



Hi Scott,

Sorry for mixing up the things.

For the case, when i have very limited amount of sample that i can not
cover 1sq.cm area, you, Matt and others have given very very clear
explanation about possible solutions and the probable effects on data
quality. I am really very thankful to all of you for sharing your
experience and expertise.

My last post was with reference to the case when i have enough powders
(i.e., reference oxide compounds). It is just to be ensured that i am
doing things 100% exactly in a same way it has to be done.

With best regards,
Jatin

--
Jatinkumar Rana



Yes, Jatin, the procedure you described is fine. There is no "right"  
way to make samples, although there are many wrong ways.


--Scott Calvin
Faculty at Sarah Lawrence College
Currently on sabbatical at Stanford Synchrotron Radiation Laboratory___
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Re: [Ifeffit] Transmission EXAFS sample

2010-11-22 Thread Scott Calvin
To my mind, when considering sample preparation the important thing is  
not so much the "right" thickness, as knowing the effects to guard  
against as the thickness deviates toward the thin or thick side.


As transmission samples become thicker, the problem of "unwanted"  
photons becomes more severe. Those photons may be harmonics, photons  
scattered into the It detector, or photons from the tails of the  
resolution curve of the monochromator.


As transmission samples become thinner, uniformity becomes more of an  
issue. If you play with the equations, you'll see that if your sample  
is a mixture of regions that have a thickness of 1.0 absorption  
lengths and regions that have a thickness of 2.0 absorption lengths,  
the spectrum is less distorted than if it is a mixture of 0.5 and 1.0  
absorption lengths.


So if a sample is on the thick side, it is particularly important to  
guard against harmonics in the beam and scattered photons. If it is on  
the thin side, it is particularly important to guard against  
nonuniformity.


To put it another way, problems are synergistic. With a well- 
conditioned beam, a uniform sample, and linear detectors, the  
thickness almost doesn't matter (within reason)--at a modern beamline,  
a total absorption of even 0.05 or 4.0 will work.


But as each of those conditions deviates from the ideal, distortions  
become much more severe.


There's an old joke about someone on a diet going in to a fast food  
joint and asking for a double bacon cheeseburger, a large fries...and  
a diet Coke. In XAFS measurements, that attitude actually kind of  
works, because of the synergies I just discussed.


Personally, I trust my ability to condition the beam and minimize  
scattering more than I trust my ability to make a uniform sample, so I  
lean a little toward the thicker side.


--Scott Calvin
Faculty at Sarah Lawrence College
Currently on sabbatical at Stanford Synchrotron Radiation Laboratory



On Nov 22, 2010, at 5:13 AM, Welter, Edmund wrote:


Dear Jatin,

the optimum mued of 2.x is not just derived by simple photon counting
statistics. As Matt pointed out, for transmission measurements at a
synchrotron beamline in conventional scanning mode this is seldom a
matter. Nevertheless, one should avoid to measure subtle changes of
absorption at the extreme ends, that is, transmission near 0 % or  
100 %.

In optical photometry this is described by the more or less famous
"Ringbom plots" which describe the dependency of the accuracy of
quantitative analysis by absorption measurements (usually but not
necessarily in the UV/Vis) from the total absorption of the sample.

This time the number is only near to 42, the optimum transmission is
36.8 % (mue = 1). So, to achieve the highest accuracy in the
determination of small Delta c (c = concentration) you should try to
measure samples with transmissions near to this value (actually the
minimum is broad and transmissions between 0.2 and 0.7 are ok). In our
case, we are not interested in the concentration of the absorber,  
but we

are also interested in (very) small changes of the transmission resp.
absorption in our samples. Or, using Bouger, Lambert Beer's law, in  
our
case mue (-ln(I1/I0) is a function of the absorption coefficient  
(mue0).

The concentration of the absorber and the thickness (d) of the sample
are constant.

-ln(I1/I0) = mue0 * c * d

But then: If the optimum is a mue between 0.35 and 1.6 why are we all
measuring successfully (ok, more or less ;-) using samples having a  
mue
between 2 and 3? ...and 0.35 seems desperately small to me! Maybe  
sample

homogeneity is an issue?

Cheers,
Edmund Welter




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Re: [Ifeffit] Transmission EXAFS sample

2010-11-22 Thread Jatinkumar Rana

On 21.11.2010 19:00, ifeffit-requ...@millenia.cars.aps.anl.gov wrote:

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Today's Topics:

1. Re: Transmission EXAFS sample (Jatinkumar Rana)
2. Re: Transmission EXAFS sample (Scott Calvin)


--

Message: 1
Date: Sun, 21 Nov 2010 11:44:25 +0100
From: Jatinkumar Rana
To:ifeffit@millenia.cars.aps.anl.gov
Subject: Re: [Ifeffit] Transmission EXAFS sample
Message-ID:<4ce8f809.3040...@helmholtz-berlin.de>
Content-Type: text/plain; charset=ISO-8859-1; format=flowed

On 20.11.2010 19:00,ifeffit-requ...@millenia.cars.aps.anl.gov  wrote:
   

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When replying, please edit your Subject line so it is more specific
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Today's Topics:

 1. Re: Transmission EXAFS sample (Scott Calvin)
 2. Re: Transmission EXAFS sample (Frenkel, Anatoly)


--

Message: 1
Date: Fri, 19 Nov 2010 10:30:37 -0800
From: Scott Calvin
To: XAFS Analysis using Ifeffit
Subject: Re: [Ifeffit] Transmission EXAFS sample
Message-ID:
Content-Type: text/plain; charset=US-ASCII; format=flowed; delsp=yes

Hi Jatin,

Matt covered most of what I would say, but I'll add a few comments of
my own.

I'm not sure how you arrived at the conclusion that you have only a
few percent of what you need--you must be assuming a sample area
somehow. I have frequently made transmission measurements on samples
where I only had a few milligrams available. Generally, I did it by
spreading it on a layer of tape as well as I could and then folding
the tape over and over again--sometimes to make as many as 16 layers.
(Of course, that many layers is not advisable if you're below 6 keV or
so, as the absorption of the tape itself would kill the signal). Even
if there are lots of pinholes because you can't cover the tape
effectively, 16 layers from folding will make them cancel out fairly
well. I can then narrow the beam a bit to match the size of my sample.
Flux isn't really the issue here, so I don't even need a focussed
beamline--I can just narrow the slits.

Two other tips:

1) Realize that even with a tiny amount of sample that much of it
won't end up on the tape. The process of brushing on tape is designed
to separate the small grains from the big ones, with only the small
ones ending up on tape. Allow that to happen!

2) You can sometimes get a second piece of tape to have some sample on
it by putting it sticky side down on your mortar and peeling it back.
A thin layer of dust from the sample will stick to the tape, and give
you a little more absorption and a bit more of a uniform distribution.
If you stack that with the primary piece of tape and then fold a few
times, you may end up in pretty good shape, as long as you're not
operating at a low enough energy so that all the layers of tape are a
problem..

This procedure doesn't give me the best data I've ever seen, but it's
often not bad.

--Scott Calvin
Sarah Lawrence College

On Nov 19, 2010, at 8:13 AM, Matt Newville wrote:


 

Dear Jatin,

The idea that the optimum absorption length (mu*t) for transmission
experiments is 2.3 assumes that the errors in the measurement are due
to counting statistics of the x-rays.  For any synchrotron experiment,
the number of x-rays in the transmission chamber is high enough that
the noise from counting statistics is rarely significant.  This means
that using a value of 2.3 is really not that important.

The more important issues are
   a) having a uniform sample.
   b) not having (mu*t) so high that higher-order harmonics dominate
the transmission measurement.

For transmission measurements, it's difficult to overstate the
importance of a uniform sample.  For an ideal thickness, I would say
that the better rules of thumb than mu*t = 2.3 are to aim for an edge
step of 0.1 to 1.0, and a total absorption less than 3.0.

If you only have enough material for an edge

Re: [Ifeffit] Transmission EXAFS sample

2010-11-22 Thread Welter, Edmund

Dear Jatin,

the optimum mued of 2.x is not just derived by simple photon counting 
statistics. As Matt pointed out, for transmission measurements at a 
synchrotron beamline in conventional scanning mode this is seldom a 
matter. Nevertheless, one should avoid to measure subtle changes of 
absorption at the extreme ends, that is, transmission near 0 % or 100 %. 
In optical photometry this is described by the more or less famous 
"Ringbom plots" which describe the dependency of the accuracy of 
quantitative analysis by absorption measurements (usually but not 
necessarily in the UV/Vis) from the total absorption of the sample.


This time the number is only near to 42, the optimum transmission is 
36.8 % (mue = 1). So, to achieve the highest accuracy in the 
determination of small Delta c (c = concentration) you should try to 
measure samples with transmissions near to this value (actually the 
minimum is broad and transmissions between 0.2 and 0.7 are ok). In our 
case, we are not interested in the concentration of the absorber, but we 
are also interested in (very) small changes of the transmission resp. 
absorption in our samples. Or, using Bouger, Lambert Beer's law, in our 
case mue (-ln(I1/I0) is a function of the absorption coefficient (mue0). 
The concentration of the absorber and the thickness (d) of the sample 
are constant.


-ln(I1/I0) = mue0 * c * d

But then: If the optimum is a mue between 0.35 and 1.6 why are we all 
measuring successfully (ok, more or less ;-) using samples having a mue 
between 2 and 3? ...and 0.35 seems desperately small to me! Maybe sample 
homogeneity is an issue?


Cheers,
Edmund Welter






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Re: [Ifeffit] Transmission EXAFS sample

2010-11-21 Thread Scott Calvin


On Nov 21, 2010, at 2:45 AM, Jatinkumar Rana wrote:




Hi Scott,

Yes I have assumed the sample cross section area to be 1 sq. cm. and
then calculated the amount of sample required for that.

What i planned  is following :

I would calculate the amount of sample required for 1sq.cm area, take
that amount of sample and make it very fine paste using mortar and
pestle, and then apply it uniformly on a piece of kapton tape. Then  
fold

the tape over and over again in such a way that final bunch of tapes
will yield to 1 sq.cm. area containing the required amount of sample.

Will it be the right approach ?? OR I can take randomly few milligrams
of powder  (i.e. not strictly as per calculation) and  make a several
uniform layers of tape ??

With best regards,
Jatin

--


Hi Jatin,

I'm not sure I understand. If you have enough sample for the 1 square  
centimeter target, then there shouldn't be a problem, right? I was  
assuming from your initial question that you weren't going to have  
enough sample to do that.


--Scott Calvin
Faculty at Sarah Lawrence College
Currently on sabbatical at Stanford Synchrotron Radiation Laboratory___
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Re: [Ifeffit] Transmission EXAFS sample

2010-11-21 Thread Jatinkumar Rana

On 20.11.2010 19:00, ifeffit-requ...@millenia.cars.aps.anl.gov wrote:

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When replying, please edit your Subject line so it is more specific
than "Re: Contents of Ifeffit digest..."


Today's Topics:

1. Re: Transmission EXAFS sample (Scott Calvin)
2. Re: Transmission EXAFS sample (Frenkel, Anatoly)


--

Message: 1
Date: Fri, 19 Nov 2010 10:30:37 -0800
From: Scott Calvin
To: XAFS Analysis using Ifeffit
Subject: Re: [Ifeffit] Transmission EXAFS sample
Message-ID:
Content-Type: text/plain; charset=US-ASCII; format=flowed; delsp=yes

Hi Jatin,

Matt covered most of what I would say, but I'll add a few comments of
my own.

I'm not sure how you arrived at the conclusion that you have only a
few percent of what you need--you must be assuming a sample area
somehow. I have frequently made transmission measurements on samples
where I only had a few milligrams available. Generally, I did it by
spreading it on a layer of tape as well as I could and then folding
the tape over and over again--sometimes to make as many as 16 layers.
(Of course, that many layers is not advisable if you're below 6 keV or
so, as the absorption of the tape itself would kill the signal). Even
if there are lots of pinholes because you can't cover the tape
effectively, 16 layers from folding will make them cancel out fairly
well. I can then narrow the beam a bit to match the size of my sample.
Flux isn't really the issue here, so I don't even need a focussed
beamline--I can just narrow the slits.

Two other tips:

1) Realize that even with a tiny amount of sample that much of it
won't end up on the tape. The process of brushing on tape is designed
to separate the small grains from the big ones, with only the small
ones ending up on tape. Allow that to happen!

2) You can sometimes get a second piece of tape to have some sample on
it by putting it sticky side down on your mortar and peeling it back.
A thin layer of dust from the sample will stick to the tape, and give
you a little more absorption and a bit more of a uniform distribution.
If you stack that with the primary piece of tape and then fold a few
times, you may end up in pretty good shape, as long as you're not
operating at a low enough energy so that all the layers of tape are a
problem..

This procedure doesn't give me the best data I've ever seen, but it's
often not bad.

--Scott Calvin
Sarah Lawrence College

On Nov 19, 2010, at 8:13 AM, Matt Newville wrote:

   

Dear Jatin,

The idea that the optimum absorption length (mu*t) for transmission
experiments is 2.3 assumes that the errors in the measurement are due
to counting statistics of the x-rays.  For any synchrotron experiment,
the number of x-rays in the transmission chamber is high enough that
the noise from counting statistics is rarely significant.  This means
that using a value of 2.3 is really not that important.

The more important issues are
  a) having a uniform sample.
  b) not having (mu*t) so high that higher-order harmonics dominate
the transmission measurement.

For transmission measurements, it's difficult to overstate the
importance of a uniform sample.  For an ideal thickness, I would say
that the better rules of thumb than mu*t = 2.3 are to aim for an edge
step of 0.1 to 1.0, and a total absorption less than 3.0.

If you only have enough material for an edge step as low as 0.02 (as
you imply), then measuring in fluorescence or electron emission is
probably a better choice.  Such a sample won't be severely affected by
"self-absorption" (or "over absorption" to use the term this mailing
list prefers) in the fluorescence measurement.  I would recommend
simultaneously measuring transmission and florescence for such a
sample.

My concern about a very thin sample is uniformity.  Specifically, is
the grain size really well below mu/0.02 so that a collection of
particles can give a uniform thickness?  Since you didn't give any
details of the system, it's hard to guess.

Is it feasible to pack that material into a smaller area so that the
thickness is increased and use a smaller x-ray beam?

 

-- Can my sample be only few percentage of the "actual amount" (i.e.
calculated based on above fact) required, and still i can perform
transmission EXAFS ? How would this affect my data ? (I guess, it
will be
heavily dominated by noise)
   

I would guess that a sample with mu*t of 0.02 would be dominated b

Re: [Ifeffit] Transmission EXAFS sample

2010-11-19 Thread Frenkel, Anatoly
That's probably how they discovered graphene, by trying to make exafs  
sample.

Anatoly

Sent from my mobile phone, please forgive typos.

-Original message-
From: Scott Calvin 
To: XAFS Analysis using Ifeffit 
Sent: Fri, Nov 19, 2010 18:30:37 GMT+00:00
Subject: Re: [Ifeffit] Transmission EXAFS sample


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Re: [Ifeffit] Transmission EXAFS sample

2010-11-19 Thread Scott Calvin

Hi Jatin,

Matt covered most of what I would say, but I'll add a few comments of  
my own.


I'm not sure how you arrived at the conclusion that you have only a  
few percent of what you need--you must be assuming a sample area  
somehow. I have frequently made transmission measurements on samples  
where I only had a few milligrams available. Generally, I did it by  
spreading it on a layer of tape as well as I could and then folding  
the tape over and over again--sometimes to make as many as 16 layers.  
(Of course, that many layers is not advisable if you're below 6 keV or  
so, as the absorption of the tape itself would kill the signal). Even  
if there are lots of pinholes because you can't cover the tape  
effectively, 16 layers from folding will make them cancel out fairly  
well. I can then narrow the beam a bit to match the size of my sample.  
Flux isn't really the issue here, so I don't even need a focussed  
beamline--I can just narrow the slits.


Two other tips:

1) Realize that even with a tiny amount of sample that much of it  
won't end up on the tape. The process of brushing on tape is designed  
to separate the small grains from the big ones, with only the small  
ones ending up on tape. Allow that to happen!


2) You can sometimes get a second piece of tape to have some sample on  
it by putting it sticky side down on your mortar and peeling it back.  
A thin layer of dust from the sample will stick to the tape, and give  
you a little more absorption and a bit more of a uniform distribution.  
If you stack that with the primary piece of tape and then fold a few  
times, you may end up in pretty good shape, as long as you're not  
operating at a low enough energy so that all the layers of tape are a  
problem..


This procedure doesn't give me the best data I've ever seen, but it's  
often not bad.


--Scott Calvin
Sarah Lawrence College

On Nov 19, 2010, at 8:13 AM, Matt Newville wrote:


Dear Jatin,

The idea that the optimum absorption length (mu*t) for transmission
experiments is 2.3 assumes that the errors in the measurement are due
to counting statistics of the x-rays.  For any synchrotron experiment,
the number of x-rays in the transmission chamber is high enough that
the noise from counting statistics is rarely significant.  This means
that using a value of 2.3 is really not that important.

The more important issues are
 a) having a uniform sample.
 b) not having (mu*t) so high that higher-order harmonics dominate
the transmission measurement.

For transmission measurements, it's difficult to overstate the
importance of a uniform sample.  For an ideal thickness, I would say
that the better rules of thumb than mu*t = 2.3 are to aim for an edge
step of 0.1 to 1.0, and a total absorption less than 3.0.

If you only have enough material for an edge step as low as 0.02 (as
you imply), then measuring in fluorescence or electron emission is
probably a better choice.  Such a sample won't be severely affected by
"self-absorption" (or "over absorption" to use the term this mailing
list prefers) in the fluorescence measurement.  I would recommend
simultaneously measuring transmission and florescence for such a
sample.

My concern about a very thin sample is uniformity.  Specifically, is
the grain size really well below mu/0.02 so that a collection of
particles can give a uniform thickness?  Since you didn't give any
details of the system, it's hard to guess.

Is it feasible to pack that material into a smaller area so that the
thickness is increased and use a smaller x-ray beam?


-- Can my sample be only few percentage of the "actual amount" (i.e.
calculated based on above fact) required, and still i can perform
transmission EXAFS ? How would this affect my data ? (I guess, it  
will be

heavily dominated by noise)


I would guess that a sample with mu*t of 0.02 would be dominated by  
pinholes.


-- What if, i have required amount of sample but since material's  
density is
so high that it yields only small volume of powder (for a given  
weight),
that it can not be covered up on multiple layers of Kapton tape to  
ensure

pinhole-free sample ?


If you cannot get the grain size small enough to have many overlapping
grains in the sample, the sample won't be uniform enough for good
transmission data.  The techniques of using multiple layers of mixing
with a low-Z binder don't solve this problem.  These do help to make a
uniform collection of overlapping grains, but don't make the grains
smaller.

I would recommend trying to increase the thickness at the expense of
cross-sectional area, and/or measuring in both transmission and
fluorescence.

Hope that helps,

--Matt
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Re: [Ifeffit] Transmission EXAFS sample

2010-11-19 Thread Matt Newville
Dear Jatin,

The idea that the optimum absorption length (mu*t) for transmission
experiments is 2.3 assumes that the errors in the measurement are due
to counting statistics of the x-rays.  For any synchrotron experiment,
the number of x-rays in the transmission chamber is high enough that
the noise from counting statistics is rarely significant.  This means
that using a value of 2.3 is really not that important.

The more important issues are
  a) having a uniform sample.
  b) not having (mu*t) so high that higher-order harmonics dominate
the transmission measurement.

For transmission measurements, it's difficult to overstate the
importance of a uniform sample.  For an ideal thickness, I would say
that the better rules of thumb than mu*t = 2.3 are to aim for an edge
step of 0.1 to 1.0, and a total absorption less than 3.0.

If you only have enough material for an edge step as low as 0.02 (as
you imply), then measuring in fluorescence or electron emission is
probably a better choice.  Such a sample won't be severely affected by
"self-absorption" (or "over absorption" to use the term this mailing
list prefers) in the fluorescence measurement.  I would recommend
simultaneously measuring transmission and florescence for such a
sample.

My concern about a very thin sample is uniformity.  Specifically, is
the grain size really well below mu/0.02 so that a collection of
particles can give a uniform thickness?  Since you didn't give any
details of the system, it's hard to guess.

Is it feasible to pack that material into a smaller area so that the
thickness is increased and use a smaller x-ray beam?

> -- Can my sample be only few percentage of the "actual amount" (i.e.
> calculated based on above fact) required, and still i can perform
> transmission EXAFS ? How would this affect my data ? (I guess, it will be
> heavily dominated by noise)

I would guess that a sample with mu*t of 0.02 would be dominated by pinholes.

> -- What if, i have required amount of sample but since material's density is
> so high that it yields only small volume of powder (for a given weight),
> that it can not be covered up on multiple layers of Kapton tape to ensure
> pinhole-free sample ?

If you cannot get the grain size small enough to have many overlapping
grains in the sample, the sample won't be uniform enough for good
transmission data.  The techniques of using multiple layers of mixing
with a low-Z binder don't solve this problem.  These do help to make a
uniform collection of overlapping grains, but don't make the grains
smaller.

I would recommend trying to increase the thickness at the expense of
cross-sectional area, and/or measuring in both transmission and
fluorescence.

Hope that helps,

--Matt
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Re: [Ifeffit] Transmission EXAFS sample

2010-11-19 Thread Dr. Dariusz A. Zając

 Hi Jatin
from my modest experience the problem comes with the noise from 
detectors (typically from ionisation chambers- before and after sample).
When the sample is too thick than signal/noise ratio becomes smaller, 
that means you are limited in k space. I have measured liquid samples 
with edge jump ~0.1 (in ln scale) and this allowed me to observe changes 
in the first coordination shell, but nothing more. If you measure you 
can also try to rotate sample 45 deg.
answering for your second question - usually I mix sample with 
cellulose, or with other powders and make a pellet.
with such small signal you can also think about TFY (e.g. PIPS diode) - 
it gives sometimes in such situation better signal/noise ratio

cheers
kicaj

W dniu 10-11-19 10:55, Jatinkumar Rana pisze:

Dear all,

I have very basic question about the sample preparation for EXAFS. It 
is well understood and proven by several researchers that the optimum 
amount of sample (per unit area) required for EXAFS is determined by 
the fact that the total absorbtion of the entire sample above the 
absorption edge (of interest) should be between 2 to 2.5, more 
precisely, it should be 2.3.


The reason which forces me to put this question to a mailing list is 
that, i treat my sample through a process which yields only few 
percentage of the total amount of sample required for EXAFS. I would 
prefer to measure EXAFS in transmission mode with samples prepared on 
several layers of Kapton tape which are bound together to ensure 
pinhole free sample.


My questions are :

-- Can my sample be only few percentage of the "actual amount" (i.e. 
calculated based on above fact) required, and still i can perform 
transmission EXAFS ? How would this affect my data ? (I guess, it will 
be heavily dominated by noise)


-- What if, i have required amount of sample but since material's 
density is so high that it yields only small volume of powder (for a 
given weight), that it can not be covered up on multiple layers of 
Kapton tape to ensure pinhole-free sample ?


I look forward to any comments or suggestions as this would help me 
improvise the quality of my data.


With best regards,
Jatin



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[Ifeffit] Transmission EXAFS sample

2010-11-19 Thread Jatinkumar Rana

Dear all,

I have very basic question about the sample preparation for EXAFS. It is 
well understood and proven by several researchers that the optimum 
amount of sample (per unit area) required for EXAFS is determined by the 
fact that the total absorbtion of the entire sample above the absorption 
edge (of interest) should be between 2 to 2.5, more precisely, it should 
be 2.3.


The reason which forces me to put this question to a mailing list is 
that, i treat my sample through a process which yields only few 
percentage of the total amount of sample required for EXAFS. I would 
prefer to measure EXAFS in transmission mode with samples prepared on 
several layers of Kapton tape which are bound together to ensure pinhole 
free sample.


My questions are :

-- Can my sample be only few percentage of the "actual amount" (i.e. 
calculated based on above fact) required, and still i can perform 
transmission EXAFS ? How would this affect my data ? (I guess, it will 
be heavily dominated by noise)


-- What if, i have required amount of sample but since material's 
density is so high that it yields only small volume of powder (for a 
given weight), that it can not be covered up on multiple layers of 
Kapton tape to ensure pinhole-free sample ?


I look forward to any comments or suggestions as this would help me 
improvise the quality of my data.


With best regards,
Jatin

--
Jatinkumar Rana

Helmholtz-Zentrum Berlin für Materialien und Energie GmbH
Institut für angewandte Materialforschung
FI-1 Mikrostruktur

Hahn-Meitner-Platz 1
D-14109 Berlin Germany
Tel: +49 30 8062-43217
Fax: +49 30 8062-43059
eMail: jatinkumar.r...@helmholtz-berlin.de



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