Re: [dpdk-dev] [PATCH v3 3/6] test/hash: test more corner cases in unit test

> > --- a/test/test/test_hash_readwrite.c > > +++ b/test/test/test_hash_readwrite.c > > test_hash_readwrite_worker(__attribute__((unused)) void *arg) > > uint64_t i, offset; > > uint32_t lcore_id = rte_lcore_id(); > > uint64_t begin, cycles; > > -int ret; > > +int *ret; > > > > +ret = rte_malloc

Re: [dpdk-dev] [PATCH v3 3/6] test/hash: test more corner cases in unit test

> > This commit improves the readwrite unit test to cover more corner cases and > reduces the testing time by reducing the total key count. > > Signed-off-by: Yipeng Wang > Acked-by: Bruce Richardson > --- > test/test/test_hash_readwrite.c | 31 +-- > 1 file changed,