AW: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability

2024-07-18 Thread Christofer Dutz
: Christofer Dutz Datum: Donnerstag, 18. Juli 2024 um 10:48 An: dev@iotdb.apache.org Betreff: AW: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability And just so you know how huge this problem is: https://infra-reports.apache.org/#ghactions

AW: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability

2024-07-18 Thread Christofer Dutz
, leaving less than 5% for the other 200 projects we have. Chris Von: Christofer Dutz Datum: Donnerstag, 18. Juli 2024 um 10:41 An: dev@iotdb.apache.org Betreff: AW: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability I think for some tests

AW: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability

2024-07-18 Thread Christofer Dutz
make it Unit-Testable and then we can gradually reduce the load on the integration-test suite. Chris Von: Tian Jiang Datum: Donnerstag, 18. Juli 2024 um 10:35 An: dev Betreff: Re: AW: AW: AW: Possible pattern for reducing the negative effects of using singletons and improving testability