Re: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-25 Thread Ryan Moats
Liran Schour/Haifa/IBM wrote on 07/25/2016 02:44:42 AM: > From: Liran Schour/Haifa/IBM > To: Ryan Moats > Cc: dev@openvswitch.org > Date: 07/25/2016 02:44 AM > Subject: Re: [ovs-dev] [PATCH] ovn-controller: Handle physical > changes correctly > > > From: Ryan Moats

Re: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-25 Thread Liran Schour
> From: Ryan Moats > To: dev@openvswitch.org > Date: 23/07/2016 12:57 AM > Subject: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly > Sent by: "dev" > > [1] reported increased failure rates in certain tests > with incremental process

Re: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-23 Thread Lance Richardson
- Original Message - > From: "Ryan Moats" > To: dev@openvswitch.org > Sent: Friday, July 22, 2016 5:54:26 PM > Subject: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly > > [1] reported increased failure rates in certain tests > with incr

Re: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-23 Thread Ryan Moats
Ben Pfaff wrote on 07/22/2016 06:57:59 PM: > From: Ben Pfaff > To: Ryan Moats/Omaha/IBM@IBMUS > Cc: dev@openvswitch.org > Date: 07/22/2016 06:58 PM > Subject: Re: [ovs-dev] [PATCH] ovn-controller: Handle physical > changes correctly > > On Fri, Jul 22, 2016 at 09:5

Re: [ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-22 Thread Ben Pfaff
On Fri, Jul 22, 2016 at 09:54:26PM +, Ryan Moats wrote: > [1] reported increased failure rates in certain tests > with incremental processing (the numbers are the number of failures > seen in 100 tests): > >2 ovn -- vtep: 3 HVs, 1 VIFs/HV, 1 GW, 1 LS > 10 ovn -- 2 HVs, 2 LS, 1 lport/LS

[ovs-dev] [PATCH] ovn-controller: Handle physical changes correctly

2016-07-22 Thread Ryan Moats
[1] reported increased failure rates in certain tests with incremental processing (the numbers are the number of failures seen in 100 tests): 2 ovn -- vtep: 3 HVs, 1 VIFs/HV, 1 GW, 1 LS 10 ovn -- 2 HVs, 2 LS, 1 lport/LS, 2 peer LRs 52 ovn -- 1 HV, 1 LS, 2 lport/LS, 1 LR 45 ovn -- 1 HV