Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-20 Thread Hector Martin 'marcan' via dev-security-policy
On 17/10/17 20:36, Nick Lamb via dev-security-policy wrote: The bitmasks are effectively lists of expected remainders for each small prime, if your modulus has an expected remainder for all the 20+ small primes that distinguish Infineon, there's a very high chance it was generated using their

Re: ROCA fingerprints found on crt.sh (was Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards)

2017-10-18 Thread Kim Nguyen via dev-security-policy
Hi Rob, all, we are treating this as an incident although all certs related to D-Trust are indeed Qualified/EUTL certs governed by National German Law and are not chaining up to roots that trusted by NSS, hence are not related to the WekbPKI. An incident report will be submitted by tomorrow

Re: ROCA fingerprints found on crt.sh (was Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards)

2017-10-18 Thread Kim Nguyen via dev-security-policy
Am Mittwoch, 18. Oktober 2017 11:15:03 UTC+2 schrieb Rob Stradling: > I've completed a full scan of the crt.sh DB, which found 171 certs with > ROCA fingerprints. > > The list is at https://misissued.com/batch/28/ > > Many of these are Qualified/EUTL certs rather than anything to do with > the

Re: ROCA fingerprints found on crt.sh (was Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards)

2017-10-18 Thread Matthew Hardeman via dev-security-policy
On Wednesday, October 18, 2017 at 4:15:03 AM UTC-5, Rob Stradling wrote: > The list is at https://misissued.com/batch/28/ > > Many of these are Qualified/EUTL certs rather than anything to do with > the WebPKI. Only about half of them chain to roots that are trusted by NSS. > It's really

ROCA fingerprints found on crt.sh (was Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards)

2017-10-18 Thread Rob Stradling via dev-security-policy
I've completed a full scan of the crt.sh DB, which found 171 certs with ROCA fingerprints. The list is at https://misissued.com/batch/28/ Many of these are Qualified/EUTL certs rather than anything to do with the WebPKI. Only about half of them chain to roots that are trusted by NSS. On

Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-17 Thread Rob Stradling via dev-security-policy
On 16/10/17 23:15, Jakob Bohm via dev-security-policy wrote: Unfortunately, as of right now, their github repository still doesn't include the promised C/C++ implementation, Hi Jakob. Today I ended up rewriting the ROCA fingerprint checker in C (using OpenSSL BIGNUM calls) to get it working

RE: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-17 Thread Tim Hollebeek via dev-security-policy
ecurity-policy Sent: Tuesday, October 17, 2017 7:37 AM To: mozilla-dev-security-pol...@lists.mozilla.org Subject: Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards On Monday, 16 October 2017 23:15:51 UTC+1, Jakob Bohm wrote: > They have also obfuscated their test by provi

Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-17 Thread Nick Lamb via dev-security-policy
On Monday, 16 October 2017 23:15:51 UTC+1, Jakob Bohm wrote: > They have also obfuscated their test by providing bitmasks as decimal > bigints instead of using hexadecimal or any other format that makes the > bitmasks human readable. The essential fingerprinting trick comes down to this (I had

Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-16 Thread Matt Palmer via dev-security-policy
On Mon, Oct 16, 2017 at 09:14:29PM +0100, Rob Stradling via dev-security-policy wrote: > On 16/10/17 20:01, Matthew Hardeman via dev-security-policy wrote: > > The authors of the paper on the weak RSA keys generated by Infineon TPMs > > and smart cards have published code in multiple languages /

Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-16 Thread Jakob Bohm via dev-security-policy
On 16/10/2017 21:01, Matthew Hardeman wrote: The authors of the paper on the weak RSA keys generated by Infineon TPMs and smart cards have published code in multiple languages / platforms that provide for an efficient test for weakness by way of the Infineon TPM bug. Perhaps this should be a

Re: Efficient test for weak RSA keys generated in Infineon TPMs / smartcards

2017-10-16 Thread Rob Stradling via dev-security-policy
On 16/10/17 20:01, Matthew Hardeman via dev-security-policy wrote: The authors of the paper on the weak RSA keys generated by Infineon TPMs and smart cards have published code in multiple languages / platforms that provide for an efficient test for weakness by way of the Infineon TPM bug.