-Original Message-
From: Rich Nute [mailto:ri...@sdd.hp.com]
Sent: Friday, January 31, 2003 4:17 PM
To: j...@jmwa.demon.co.uk
Cc: emc-p...@majordomo.ieee.org
Subject: Re: single fault conditions
Hi John:
For example, at a previous employer, I observed several
instances
I read in !emc-pstc that Rich Nute ri...@sdd.hp.com wrote (in
200301311743.jaa24...@epgc264.sdd.hp.com) about 'single fault
conditions' on Fri, 31 Jan 2003:
So, the failure of switching FETs could give rise
to both fire and shock, but should not do so if the
equipment construction is according
Hi John:
The Bad: some FETs fail very violently, and can actually be a fire hazard
and/or shock hazard in open-frame switchers;
Really? There doesn't seem to be enough combustible material to cause a
fire hazard, and an open-frame switcher always has to be in some sort of
The Bad: some FETs fail very violently, and can actually be a fire hazard
and/or shock hazard in open-frame switchers;
Really? There doesn't seem to be enough combustible material to cause a
fire hazard, and an open-frame switcher always has to be in some sort of
outer enclosure, doesn't it?
I read in !emc-pstc that boconn...@t-yuden.com wrote (in F7E9180F6F7F58
40858d3db815e4f7ad1f2...@cms21.t-yuden.com) about 'single fault
conditions' on Wed, 29 Jan 2003:
Yes sir, this is another thing I've wondered about; i.e., simulating the
big
bus cap (short) SFC by applying a
I read in !emc-pstc that boconn...@t-yuden.com wrote (in F7E9180F6F7F58
40858d3db815e4f7ad1f2...@cms21.t-yuden.com) about 'single fault
conditions' on Wed, 29 Jan 2003:
The environment being considered is a switching power supply. The technique
that safety agencies use to simulate a SFC on a
I read in !emc-pstc that boconn...@t-yuden.com wrote (in F7E9180F6F7F58
40858d3db815e4f7ad1f2...@cms21.t-yuden.com) about 'single fault
conditions' on Thu, 30 Jan 2003:
I am also concerned that there are products on the market, tested in good
faith, that would be unsafe for a more
While s-c and o-c at device terminals do not simulate true
fault conditions within components, testing must be
practical. If we are to begin considering simulation of
true fault conditions within components, there may be no end
to the number of tests.
We can easily put bounds
. Tarver [ mailto:peter.tar...@sanmina-sci.com]
Sent: Thursday, January 30, 2003 9:13 AM
To: emc-p...@majordomo.ieee.org
Subject: RE: single fault conditions
While s-c and o-c at device terminals do not simulate true
fault conditions within components, testing must be
practical. If we
While s-c and o-c at device terminals do not simulate true
fault conditions within components, testing must be
practical. If we are to begin considering simulation of
true fault conditions within components, there may be no end
to the number of tests.
Simulation of internal component faults
Hi Brian:
The environment being considered is a switching power supply. The technique
that safety agencies use to simulate a SFC on a power FET does not seem,
IMHO, to simulate the actual failure mode of the device. To wit: when the
mosfet fails short, it blows itself open; so
Brian,
I believe that forcing a FET failure would be a good test but should be in
addition to the mechanical short method. If your power supply is safe for both
failure modes that would be great. The fuse should open before the failed FET
can cause a heat or fire problem. And it was already a
of the testing that I perform that the
agencies think is really great stuff...
R/S,
Brian
From: Lou Aiken [mailto:ai...@gulftel.com]
Sent: Wednesday, January 29, 2003 2:19 PM
To: boconn...@t-yuden.com; emc-p...@majordomo.ieee.org
Subject: Re: single fault conditions
Wow, I would have to think
Wow, I would have to think a while about this. The first thing that comes to
my mind, is the risk any greater than the bulk cap failure that spew debris
around, and sometimes catch fire? There is no reasonable way to simulate that.
Lou Aiken, LaMer LLC
27109 Palmetto Drive
Orange Beach, AL
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