Hi Pinit,
here is what you can expect from a SDD:
"At X-ray energies greater than silicon K absorption edge, which we have
measured for crystalline silicon to be 1839 eV, the response function of
the device shows two distinct peaks in addition to the primary one. One
of them at energy
I have an SDD and find very little strength in the escape peak or the Si Ka
peak. I have seen Si from the sample. I can't speak to how well Si XAS works
because my beamline doesn't go down that far.
mam
On 2/9/2016 10:25 AM, Pierre Lecante wrote:
Hi Pinit,
here is what you can
Hi Pinit,
here is what you can expect from a SDD:
"At X-ray energies greater than silicon K absorption edge, which we have
measured for crystalline silicon to be 1839 eV, the response function of
the device shows two distinct peaks in addition to the primary one. One
of them at energy
Dear list,
I have obtained nickel XANES spectra (attached) from metallic Zircaloy-2
nuclear fuel cladding (Zr, 1.5% Sn, 0.15% Fe, 0.1% Cr, 0.05% Ni).
In the spectrum, I identify the edge as being approximately 8331-8332 eV
(based on maximum of first derivative), as it is for pure Ni. However, I
Hello Aditya,
If I understand correctly, the nomenclature you are using is a little
misleading. The sharp feature that you are referring to is a rising-edge
feature and is not after the edge. The is a classic feature for square
planar complexes and Ni does form a lot of those. The origin of this
