[Intel-gfx] [PATCH i-g-t v3] tests/gem_exec_nop: Improved test run time

2015-11-11 Thread Derek Morton
Reduced the Sleep period to 200mS and reduced the repetition count to 7 to decrease the test run time significantly. v2: Changed uS to us v3: removed the output formatting change as the issue will be addressed in a seperate patch from Thomas Wood. Signed-off-by: Derek Morton --- tests/gem_exec_

Re: [Intel-gfx] [PATCH i-g-t v3] tests/gem_exec_nop: Improved test run time

2015-11-11 Thread Jani Nikula
On Wed, 11 Nov 2015, Derek Morton wrote: > Reduced the Sleep period to 200mS and reduced the repetition count to 7 > to decrease the test run time significantly. > > v2: Changed uS to us The electrical engineer in me insists on v4 changing mS to ms, as we're talking about time, not conductance. ;