On 8/16/24 7:44 AM, Ira Weiny wrote:
> The test event logs were created as static arrays as an easy way to mock
> events. Dynamic Capacity Device (DCD) test support requires events be
> generated dynamically when extents are created or destroyed.
>
> Modify the event log storage to be dynamica
On 8/16/24 7:44 AM, ira.we...@intel.com wrote:
> From: Navneet Singh
>
> CXL rev 3.1 section 8.2.9.2.1 adds the Dynamic Capacity Event Records.
> User space can use trace events for debugging of DC capacity changes.
>
> Add DC trace points to the trace log.
>
> Signed-off-by: Navneet Singh
On Fri, Aug 16, 2024 at 02:45:47PM -0700, Dave Jiang wrote:
>
>
> On 8/16/24 7:44 AM, ira.we...@intel.com wrote:
> > From: Navneet Singh
> >
> > Devices which optionally support Dynamic Capacity (DC) are configured
> > via mailbox commands. CXL 3.1 requires the host to issue the Get DC
> > Con
On Fri 2024-08-16 09:44:10, Ira Weiny wrote:
> The use of struct range in the CXL subsystem is growing. In particular,
> the addition of Dynamic Capacity devices uses struct range in a number
> of places which are reported in debug and error messages.
>
> To wit requiring the printing of the star
