Jonathan Cameron wrote:
> On Fri, 16 Aug 2024 09:44:32 -0500
> Ira Weiny wrote:
>
> > The test event logs were created as static arrays as an easy way to mock
> > events. Dynamic Capacity Device (DCD) test support requires events be
> > generated dynamically when extents are created or destroyed
On Fri, 16 Aug 2024 09:44:32 -0500
Ira Weiny wrote:
> The test event logs were created as static arrays as an easy way to mock
> events. Dynamic Capacity Device (DCD) test support requires events be
> generated dynamically when extents are created or destroyed.
>
> Modify the event log storage
On 8/16/24 7:44 AM, Ira Weiny wrote:
> The test event logs were created as static arrays as an easy way to mock
> events. Dynamic Capacity Device (DCD) test support requires events be
> generated dynamically when extents are created or destroyed.
>
> Modify the event log storage to be dynamica
